GT decoder having bandwidth control for ISI compensation

ABSTRACT

An optical receiver apparatus and methods for mitigating intersymbol interference (ISI) in a differentially-encoded modulation transmission system by controlling constructive and destructive transfer functions. The receiver includes a bandwidth control element for controlling transfer function bandwidth, a transfer phase controller for controlling transfer function phase and/or an imbalancer for imbalancing the transfer functions for compensating for intersymbol interference and optimizing the quality of the received optical signal.

CROSS REFERENCE TO RELATED APPLICATION

This application is a continuation-in-part of pending application Ser.No. 11/799,435 filed May 1, 2007 by the same inventors for the sameassignee which is a continuation-in-part of pending application Ser. No.11/724,017 filed Mar. 14, 2007 by the same inventors for the sameassignee.

BACKGROUND OF THE INVENTION

1. Field of the Invention

The present invention relates to apparatus and methods for adjustingconstructive and destructive transfer functions of a differentiallyencoded phase shift keyed receiver for reducing inter-symbolinterference in optical systems.

2. Description of the Prior Art

For an optical system with filters, the effective concatenated bandwidthof the filters induces intersymbol interference (ISI). The ISI causesdistortion of the signal and reduces the decision quality (the abilityto accurately detect if a bit is a logical “1” or “0”) at a receiver.This decision quality may be quantified by counting the number of errorbits and dividing it by the total number of transmitted bits. Theresulting ratio is called bit error ratio (BER). Another way ofdiscussing the quality of the signal at the receiver involvestranslating the BER to a parameter called Q using the equation Q=20 log└√{square root over (2)}erfc⁻¹(2 BER)┘ where erfc⁻¹ is the inversecomplementary error function. The distortion effect of ISI on signalquality may be viewed in a general way in a baseband eye diagram of themodulated signal where ISI causes the space between “1”and “0” symbollevels to be partially filled by the trailing and leading edges of thesymbols.

Optical signals commonly use binary phase shift keyed (BPSK) modulationwhere a carrier is modulated for data bits for logical “0” and “1” withphase shifts of 0 and π radians. The logical “0” or “1” is decoded atthe receiver by determining whether the detected signal is to the leftor right of a vertical imaginary axis of a signal vector diagram,sometimes called an IQ diagram. A detector viewed as a polar detectordetermines whether the absolute value of the received phase is greaterthan π/2 for “0” and less than π/2 for “1”. A detector viewed as arectangular detector determines whether the cosine of the phase of thesignal is negative or positive for “0” or “1”.

The BPSK optical signals may use a differentially-encoded phase shiftkeyed (DeBPSK, or DPSK) modulation format. The DPSK modulation formatencodes input data as the difference between two consecutive transmittedsymbols. The input data is differentially pre-coded using the precedingsymbol as a reference with an electrical “delay+add” function so that aninput data bit of logical “0” or “1” is encoded as a change of carrierphase of 0 or π radians relative to the preceding bit. At the detectorthe process is reversed by comparing a current bit to the preceding bit.

The DPSK decoding function may be performed using a delay lineinterferometer (DLI) and a balanced detector. The interferometer workson the principle that two waves that coincide with the same phase willadd to each other while two waves that have opposite phases will tend tocancel each other. The interferometer has an input port for receivingthe optical signal and two output ports—a constructive output port forissuing the waves that add and a destructive output for issuing thewaves that tend to cancel.

The delay line interferometer (DLI) for DPSK signals has an additionalelement of an internal delay difference between the two waves that isabout equal to the symbol time T of the DPSK modulation. Theconstructive output port issues a signal Ec=E(t)+E(t-T) and thedestructive output port issues a signal Ed=E(t)−E(t-T). The effect ofthe time T is to reverse the signals at the two output ports so that thewaves add at the destructive output port and cancel at the constructiveoutput port when consecutive bits differ by π radians. The differencebetween Ec and Ed can be detected with a direct detection intensityreceiver to determine when there is a change in phase in the signalbetween two consecutive bits and thereby estimate the logical bitscarried by the DPSK modulation.

It is an effect of this delay difference to impose a transfer functionhaving a sinusoidal amplitude response (in the frequency domain) fromthe input port to each output port. The spectral period of a cycle ofthe transfer function, equal to 1/T, is termed the free spectral range(FSR). The sinusoidal width proportional to the FSR effectively limitsthe frequency band of the signals that can be passed from the DLI inputto the constructive and destructive outputs. The phase of the frequencydomain cycle of the transfer function is termed the FSR phase.

It is commonly believed that a DLI delay difference equal to the symboltime T, and an FSR equal to the inverse of the symbol time T, is desiredin order to provide the best system performance (fewest data estimationerrors) by maximizing the difference between the signals Ec and Ed atthe constructive and destructive outputs. Considered by itself, adifferential delay not equal to the symbol time T would be expected todegrade system performance because the current and preceding symbols arenot exactly differentially compared.

SUMMARY OF THE INVENTION

The present invention provides an optical receiver and methods formitigating intersymbol interference (ISI) in a differentially-encodedmodulation transmission system by controlling constructive anddestructive transfer functions.

Briefly, an optical receiver of the present invention includes a signalprocessor having constructive and destructive transfer functions forreceiving and demodulating an optical signal having differentialmodulation. In a preferred embodiment the signal processor includes adelay line interferometer (DLI), a free spectral range (FSR) phasecontroller, and a gain imbalancer. The DLI has a transit time differenceY between two signal paths for demodulating the differential modulationsignal and defining a free spectral range (FSR) bandwidth ofconstructive and destructive transfer functions. The FSR is calculatedor adjusted so that the performance benefit obtained by controlling thetransfer functions for reducing ISI distortion is greater than theperformance that is lost by not maximizing the demodulated signals atconstructive and destructive outputs when the time difference Y is notequal to the symbol time of the modulated signal. The FSR phasecontroller adjusts the phases of the constructive and destructivetransfer functions to tune the FSR transfer functions relative to thecarrier of the modulated optical signal. The gain imbalancer applies acalculated or adjusted unequal gain to the signals in the constructiveand destructive paths for determining or modifying the constructive anddestructive transfer functions.

In a preferred embodiment, the present invention is a delay lineinterferometer for differentially demodulating an optical input signal,comprising: an optical splitter for splitting the input signal into twosignal paths having a transit time difference for providing adifferentially demodulated signal to at least one of constructive anddestructive outputs; a positionable delay element for delaying a signalalong a first direction in one of the signal paths with a selectedoptical delay, the optical delay selected according to a position of thedelay element in a second direction; and a positioning device forpositioning the delay element in the second direction for controllingthe transit time difference.

In another preferred embodiment, the present invention is a method in adelay line interferometer for differentially demodulating an opticalinput signal, comprising: splitting the input signal into two signalpaths having a transit time difference for providing a differentiallydemodulated signal to at least one of constructive and destructiveoutputs; delaying a signal traversing a positionable delay element alonga first direction in one of the signal paths with a selected opticaldelay dependent on a position of the delay element in a seconddirection; and positioning the delay element in the second direction forcontrolling the transit time difference.

In another preferred embodiment, the present invention is a delay lineinterferometer for differentially demodulating an optical input signal,comprising: an optical splitter for splitting the input signal into twosignal paths having a transit time difference for providing adifferentially demodulated signal to at least one of constructive anddestructive outputs; a movable mirror for reflecting a signal in one ofthe signal paths; and a positioning device for positioning the mirror toa selectable position for controlling the transit time difference.

In another preferred embodiment, the present invention is a method in adelay line interferometer for differentially demodulating an opticalinput signal, comprising: splitting the input signal into two signalpaths having a transit time difference for providing a differentiallydemodulated signal to at least one of constructive and destructiveoutputs; reflecting a signal in one of the signal paths with a movablemirror; and positioning the mirror to a selectable position forcontrolling the transit time difference.

In a preferred embodiment, the present invention is an optical receiver,comprising: a signal processor having constructive and destructivetransfer functions for receiving a modulated optical input signal andissuing signals at constructive and destructive outputs, respectively;at least one transfer phase element disposed in the signal processor,the transfer phase element for providing a controllable transferfunction phase for at least one of the transfer functions with respectto a frequency of the input signal; and a transfer phase controllercoupled to the transfer phase element for controlling the transferfunction phase for maximizing a difference between signal powers for theconstructive and destructive outputs.

In another preferred embodiment, the present invention is a method forreceiving an optical signal, comprising: applying constructive anddestructive transfer functions to a modulated optical input signal forproviding signals at constructive and destructive outputs, respectively,at least one of the transfer functions having a controllable transferfunction phase; and controlling the transfer function phase with respectto a frequency of the optical signal for maximizing a difference betweensignal powers for the constructive and destructive outputs.

In another preferred embodiment, the present invention is an opticalreceiver, comprising: a signal processor having constructive anddestructive transfer functions for processing a modulated optical inputsignal for providing signals at constructive and destructive outputs,respectively, at least one of the constructive and destructive transferfunctions having a controllable bandwidth; and a bandwidth controlelement disposed in the signal processor for selecting the bandwidthbased on an effective bandwidth of the input signal for compensating forsignal impairments in the input signal.

In another preferred embodiment, the present invention is a method forreceiving a modulated optical signal, comprising: processing a modulatedoptical input signal according to constructive and destructive transferfunctions for issuing signals at constructive and destructive outputs,respectively, at least one of the constructive and destructive transferfunctions having a controllable bandwidth; and controlling the bandwidthbased on an effective bandwidth of the input signal for compensating forsignal impairments in the input signal.

In another preferred embodiment, the present invention is an opticalreceiver for receiving a modulated optical signal, comprising: a signalprocessor for separating a modulated optical input signal intoconstructive and destructive signal paths; and an optical gainimbalancer disposed in at least one of the signal paths for selecting anoptical gain imbalance between the signal paths based on an effectivebandwidth of the input signal for compensating for signal impairments inthe input signal.

In another preferred embodiment, the present invention is a method ofreceiving a modulated optical signal, comprising: separating a modulatedoptical input signal into optical constructive and destructive signalpaths; and selecting an optical gain imbalance between the signal pathsbased on an effective bandwidth of the input signal for compensating forsignal impairments in the input signal.

In another preferred embodiment the present invention is an opticalreceiver for receiving a modulated optical input signal, comprising: adecoder for splitting the input signal into two signal paths having atransit time difference for providing a differentially demodulatedsignal to at least one of constructive and destructive outputs, thetransit time difference defining a free spectral range (FSR) fordefining an FSR bandwidth; and a periodic phase filter having a periodicphase response versus frequency in a first of the signal paths foraltering said FSR bandwidth for providing a reconfigured bandwidth forthe demodulated signal.

In another preferred embodiment the present invention is a method forreceiving a modulated optical input signal, comprising: splitting theinput signal into two signal paths having a transit time difference;differentially demodulating the input signal based on the transit timedifference, the transit time difference defining a free spectral range(FSR) for defining an FSR bandwidth; issuing the demodulated signal toat least one of constructive and destructive outputs; and filtering asignal in a first of the signal paths for providing a periodic phaseresponse versus frequency for altering the FSR bandwidth to provide areconfigured bandwidth for the demodulated signal.

Various preferred embodiments of the present invention will now bedescribed in detail with reference to the accompanying drawings.

DESCRIPTION OF THE DRAWINGS

FIG. 1 is a vector diagram of a BPSK signal;

FIG. 2 is a chart of constructive and destructive transfer functions ina delay line interferometer (DLI) for an adjustable free spectral range(FSR);

FIG. 3 is a block diagram of an optical transmission system of thepresent invention for receiving a modulated optical signal;

FIG. 4 is a general block diagram of an optical receiver for the systemof FIG. 3;

FIG. 5 is a detailed block diagram of an optical receiver including adelay line interferometer (DLI) for the system of FIG. 3;

FIGS. 6A, 6B and 6C illustrate delay line interferometers (DLI)s for thereceiver of FIG. 5;

FIG. 6D illustrates a DLI for the receiver of FIG. 5 having a steppedgradient of free spectral ranges;

FIG. 6E illustrates a DLI for the receiver of FIG. 5 having a smoothgradient of free spectral ranges;

FIG. 6F illustrates a DLI for the receiver of FIG. 5 having a movablemirror for selecting a free spectral range.

FIG. 7 is a simplified flow chart of a method of the present inventionfor receiving a modulated optical signal;

FIG. 8 is a flow chart of a method of the present invention using acalculated FSR and a calculated gain imbalance;

FIG. 9 is a flow chart of a method of the present invention where theFSR and the gain imbalance are adjusted for best signal quality;

FIG. 10 is a chart showing a calculation of FSR based on systembandwidth in order to compensate for the ISI in the system of FIG. 3;

FIG. 11 is a chart showing a calculation of gain imbalance based onsystem bandwidth and FSR in order to compensate for the ISI in thesystem of FIG. 3;

FIGS. 12A-B illustrate embodiments of stepped gradient FSR delayelements for the DLI of FIG. 6D;

FIGS. 12C-E illustrate embodiments of smooth gradient FSR delay elementsfor the DLI of FIG. 6E;

FIG. 13 illustrates a transfer (FSR) phase element using tilt foradjusting FSR phase for the DLIs of FIGS. 6A-G;

FIGS. 6G and 6H illustrate first and second GT decoders of the presentinvention as embodiments of the delay line interferometer of FIG. 5;

FIG. 14 is a chart of periodic phase responses for etalon filters in theGT decoders of FIGS. 6G and 6H;

FIG. 15 is a flow chart of a method for tuning the GT decoders of FIGS.6G and 6H;

FIG. 16A is chart of a transfer function for a standard delay lineinterferometer; and

FIG. 16B is a chart of a reconfigured transfer function for the GTdecoders of FIGS. 6G and 6H.

DETAILED DESCRIPTION

The details of preferred embodiments and best mode for carrying out theideas of the invention will now be presented. It should be understoodthat it is not necessary to employ all of the details of the preferredembodiments in order to carry out the idea of the invention. It shouldbe further understood that the details of the preferred embodiments maybe mixed and matched for carrying out the invention. Therefore, thesedetails should be viewed for understanding the idea of the invention butshould not to be read as limitations of the idea that is expressed inthe below listed claims.

The preferred embodiments are described in terms of binary phase shiftkeyed (BPSK) signals using a differentially-encoded BPSK (DeBPSK, orDPSK) modulation format. However, the idea of the invention may becarried out with higher order modulation formats such as quadraturephase shift keyed (QPSK), 4QAM, 8PSK, 16QAM and so on. For example, theidea can be carried out with differentially-encoded QPSK (DQPSK) and soon.

FIG. 1 is a vector representation of a binary phase shift keyed (BPSK)optical signal having phase states of 0 and π radians. Real (in-phase or“I”) and imaginary (quadrature phase or “Q”) parts of the complex BPSKoptical signal are shown on horizontal and vertical axes, respectively.The BPSK signal between phase states of 0 and π may have a trajectory inthe IQ plane of pure phase modulation (continuously changing phase withconstant amplitude); or a trajectory in the IQ plane of Mach-Zehndermodulation (continuously changing amplitude through an amplitude null);or anything in between. For a DPSK modulation format, the logical bitsare encoded as the differences between consecutive phase states.

FIG. 2 is a chart showing exemplary constructive and destructivetransfer functions, referred to below as G(ƒ) and H(ƒ), between an inputport and constructive and destructive output ports for a signalprocessor having a delay line interferometer (DLI). The transferfunctions G(ƒ) and H(ƒ) are frequency responses of transmitted opticalpower versus frequency. The vertical axis of the chart shows powertransmission. The horizontal axis of the chart shows frequency for anoptical input signal scaled to modulation symbol rate R, relative to acenter frequency of the transfer functions. The center frequency of thetransfer functions is shown as zero. The scale factor R is the inverseof the symbol time T for modulation phase states carried by the opticalsignal.

The DLI has a transit time difference Y for demodulating adifferentially modulated signal. The transit time difference Y (FIGS. 4and 5) is also referred to in some places as the differential transittime Y or simply as the time Y. The inverse of the time Y is the freespectral range (FSR) of the DLI. Looked at another way, the FSR of theDLI is defined as the period of the transfer functions G(ƒ) and H(ƒ).The constructive and destructive transfer functions G(ƒ) and H(ƒ) areshown for free spectral ranges (FSR)s of 1.0R, 1.1R, 1.2R and 1.3R.Increasing the FSR effectively increases the bandwidth of theconstructive and destructive transfer functions. The bandwidth of theconstructive transfer function in this case is the frequency spectrumbetween points at one-half the maximum amplitude or where theconstructive and destructive transfer functions cross. The bandwidth ofthe destructive transfer function is understood to be the bandwidth ofthe stop band of the constructive transfer function or where theconstructive and destructive transfer functions cross. Equations 1 and 2show constructive and destructive transfer functions G(ƒ) and H(ƒ),respectively, for the DLI.

G(ƒ)=[1+cos(2πfY)]/2  (1

H(ƒ)=[1−cos(2πfY)]/2  (2

It can be seen that the FSR transfer functions G(ƒ) and H(ƒ) areperiodic in the frequency domain. Phase of the periodic transferfunction (offset in the frequency domain) is known as an FSR phase. Inan optical system using differential modulation, best signal quality maybe obtained when the FSR phase is adjusted so that the transferfunctions G(ƒ) and H(ƒ) have a maximum ratio or normalized difference(difference scaled by the sum) at the carrier frequency of the opticalsignal or the center of the energy in the spectrum of the modulatedoptical signal. FIG. 2 shows the correct adjustment for the transferfunction phase or FSR phase for maximum transfer function differencewith the center frequency of the transfer functions aligned to thecenter frequency and carrier frequency of the received optical inputsignal for a symmetrical optical input signal spectrum.

FIG. 3 is a block diagram of a data transmission system of the presentinvention referred to with a reference number 10. The system 10 includesan optical transmitter 12 and an optical receiver 20. The transmitter 12and the receiver 20 are connected through an optical transmission link16. The transmission link 16 may use wavelength division multiplexing(WDM) for carrying several optical signals simultaneously usingdifferent optical carrier frequencies.

The transmitter 12 transmits an optical signal using adifferentially-encoded phase shift keyed (DPSK) modulation format wherelogical 1's and 0's of input data are encoded as phase differencesbetween adjacent (consecutive in time) phase states. For example forDPSK, adjacent phase states of 0 radians and adjacent phase states of πradians both carry a data bit having a logical “0”; and a phase state of0 radians following a phase state of π radians and a phase state of πradians following a phase state of 0 radians both carry a data bithaving a logical “1”. Of course, the logical “0” and logical “1” may bereversed without loss of generality. It should also be noted that anytwo phase states that are separated by π radians may be used for theDPSK modulation.

The transmitter 12 illuminates one end of the link 16 with a modulatedoptical signal 22 having differentially-encoded phase shift keyed (DPSK)modulation for the logical bits of input data. The signal 22 passesthrough the link 16 and emerges at the other end of the link 16 as amodulated optical signal 24 to be received by the receiver 20. The link16 has a frequency response having an effective optical bandwidth causedby one or more filters represented by filters 26. The optical bandwidthof the link 16 results in an effective optical bandwidth of the spectrumof the input signal 24.

The receiver 20 demodulates the signal 24 for providing output data thatis its best estimate of the input data. The output data is desired to bean exact replica of the input data. However, the transmission link 16degrades or impairs the quality of the received signal 24 and thisdegradation or impairment in signal quality causes the receiver 20 tooccasionally make errors in the output data that it provides. One of theprimary causes of the signal degradation is intersymbol interference(ISI) in the link 16 induced by the filters 26. The receiver 20 of thepresent invention has apparatus and methods, described below, forcompensating for the quality degradation in the link 16, especially theISI, in order to reduce the errors in the output data.

The apparatus and methods of the receiver 20 use measurements of signalquality and calculations based on the effective optical bandwidth of thelink 16 and/or the effective optical bandwidth of the input signal 24for compensating for one or more signal degradations or impairments inthe input signal that may include but are not limited to ISI,signal-dependent noise and signal independent noise. The signal qualitymeasurements may be bit error ratio (BER) measurements or eye openingratio measurements. In some cases the signal quality measurements mayuse signal-to-noise measurements taken from optical or electricalconstructive and destructive path signals in the receiver 20. In apreferred embodiment, the receiver 20 uses calculations based on theeffective optical bandwidth of the link 16 for minimizing the BER forthe received input signal 24.

FIG. 4 is a block diagram of an optical receiver of the presentinvention referred to with the reference number 20. The receiver 20receives the optical signal 24 and provides output data that is its bestestimate of the input data that was transmitted by the transmitter 12.

The receiver 20 includes a demodulator 30 and a data estimator 32. Thereceiver 20 or an external computer includes a bandwidth controlalgorithm 33. The demodulator 30 demodulates the optical input signal 24and issues an electrical baseband signal. The data estimator 32processes the baseband signal and issues the output data. The receiver20 may also include an input optical filter for filtering the opticalsignal 24 into a channel when the optical signal 24 is wavelengthdivision multiplexed (WDM) and contains multiple channels.

The demodulator 30 includes a signal processor 34, a detector apparatus35, a combiner 36, and a transfer phase controller 37. The signalprocessor 34 has two parts, an optical signal processor 34A and anelectrical signal processor 34B. The optical signal processor 34Areceives the signal 24 at an input port 42; separates the signal 24 intooptical constructive and destructive interference signals;differentially demodulates the signal 24 with a differential transittime Y; and issues the signals at constructive and destructive outputports 43A and 44A, respectively. The detector apparatus 35 receives theoptical constructive and destructive paths signals from the ports 43Aand 44A and converts photons to electrons for providing electricalconstructive and destructive path signals shown as electrical currentsi_(G) and i_(H) for the modulations on the optical signals.

The signal processor 34B processes the electrical signals and passes theprocessed electrical signals through constructive and destructive outputports 43B and 44B, respectively, to the combiner 36. The combiner 36takes a difference between the instantaneous signal level of theconstructive path signal and the instantaneous signal level of thedestructive path signal for providing the baseband signal. In avariation of the receiver 20, the data estimator 32 connects to theports 43B and 44B for receiving differential electrical signals.

The separation of the input signal 24 using optical interference intothe constructive and destructive paths provides the constructive anddestructive transfer functions G(ƒ) and H(ƒ), respectively, in thesignal processor 34A. The transfer functions G(ƒ) and H(ƒ) are a part ofthe constructive and destructive transfer functions provided by thesignal processor 34 and the detector apparatus 35 from the input port 42to the constructive and destructive output ports 43B and 44B,respectively. However in one preferred embodiment the constructive anddestructive transfer functions are primarily determined within thesignal processor 34A to the output ports 43A and 44A.

The transfer phase controller 37 includes a detector 45 for measuringand averaging power-related levels for the signals at the output ports43A and 44A (or 43B and 44B). The power-related levels that are measuredare indicative of, or have a monotonic relationship to, the signalpowers at the output ports 43A and 44A (or the output ports 43B and44B). For example, the measurements may be signal power, average signalmagnitude, squared signal level, or absolute value of signal level withan arbitrary exponent. The transfer phase controller 37 uses themeasurements for providing a feedback signal that maximizes the ratio ofthe signal power for the port 43A to the signal power for the port 44A(or the signal power for the port 43B to the signal power for the port44B). The idea may also be used in an inverted mode for maximizing theratio of the signal power for the port 44A to the signal power for theport 43A (or the signal power for the port 44B to the signal power forthe port 43B).

The signal processor 34A has controllable transfer phase elements 46Gand 46H for providing adjustable phase shifts Φ_(G) and Φ_(H) for theconstructive and destructive transfer functions. The elements 46G and46H may be the same physical element 46 and the phase shifts Φ_(G) andΦ_(H) may be the same phase shift Φ. The transfer phase controller 37uses the power-related measurements from the detection 45 forcontrolling the elements 46G and 46H, or the element 46, for adjustingthe phases Φ_(G) and Φ_(H), or the phase Φ, for shifting the phases ofthe transfer functions for a maximum normalized signal power differencebetween the signals at the constructive port 43A (or 43B) and thedestructive port 44A (or 44B). This process may be used to tune thetransfer functions G(ƒ) and H(ƒ) relative to the carrier frequency ofthe modulated optical signal 24 and at the center frequency of theenergy in the modulated optical signal 24.

The signal processor 34A has a transfer bandwidth element 48 forproviding a selectable or controllable bandwidth (BW). At least one ofthe constructive and destructive transfer functions depends, at least inpart, upon this bandwidth. In a preferred embodiment the optical signalprocessor 34A includes a delay line interferometer (DLI). In this casethe bandwidth is defined or modified by the inverse of the time Y.

During the design or installation of the receiver 20, or when thereceiver 20 is in operation, a calculation or test is made, or activefeedback is provided, for signal quality or a bit error ratio of theoutput data. A primary degradation of the signal quality in the system10 is intersymbol interference (ISI) caused by the filters 26. Thebandwidth control algorithm 33 calculates or provides feedback fordetermining or controlling the transfer bandwidth element 48 as shown inthe chart of FIG. 10. The calculation or test, or active feedback, isused for selecting or controlling the element 48 in order to select oradjust the bandwidth for providing the best signal quality or minimumISI for the system 10. The signal quality may be measured on the opticalor electrical signals, by measuring eye opening in a baseband signal orby measuring bit error ratio (BER).

An imbalance control algorithm 64 may be included for calculating a gainimbalance or providing feedback from signal quality data to the signalprocessor 34 to either the optical processor 34A or the electricalprocessor 34B or both for optimizing signal quality. The signalprocessor 34 uses the gain imbalance calculations or feedback toimbalance the gains between the constructive and destructive pathsignals. The gain imbalance calculations may be based on the effectiveoptical bandwidth of the link 16 and the input signal 24.

A side effect of changing the selection of the transit time difference Yis that the transfer function phase or FSR phase of the transferfunctions G(ƒ) and H(ƒ) may slide many cycles with respect to thefrequency of the input signal 24. In a general rule, whenever the FSRdelay is changed, the transfer function phase shift Φ, or phase shiftsΦ_(G) and Φ_(H), must be re-adjusted by the transfer (FSR) phasecontroller 37 by adjusting the transfer (FSR) phase element 46, or 46Gand 46H, for re-centering the transfer functions G(ƒ) and H(ƒ) to itsoptimal frequency position. When the received optical spectrum issymmetrical, the optimal position coincides with the carrier frequencyof the input optical signal 24. On the other hand the effect of changingthe phase shift Φ, or phase shifts Φ_(G) and Φ_(H), on the FSR bandwidthis so small that is insignificant.

The receiver 20 may also include a path for signal quality feedback 92.Data for signal quality is processed through the signal quality feedback92 and passed to the transfer phase controller 37. The transfer phasecontroller 37 uses the processed signal quality data for fine tuning thephase delay of the transfer phase element 46 for improving andoptimizing the signal quality. Preferably, the element 46 is first tunedin a feedback loop according to the power-related measurements and thenfine tuned in a second feedback loop for minimizing a bit error ratio(BER). The signal quality data may be obtained by measuring BERdirectly, by measuring an eye opening ratio of a baseband signal, and/orby measuring a signal to noise ratio (SNR) of the optical or electricalconstructive and destructive path signals.

FIG. 5 is a detailed block diagram of an optical receiver of the presentinvention referred to with a reference number 120. The receiver 120 isan embodiment of the receiver 20 described above for the system 10.Elements of the receiver 120 that are analogous to, or embodiments of,elements of the receiver 20 are denoted by incrementing the referenceidentification numbers by 100.

The receiver 120 includes a demodulator 130, a data estimator 132 and abit error ratio (BER) detector 138. The receiver 120, or an externalcomputer, also includes a bandwidth (FSR) control algorithm 133, and animbalance control algorithm 164. The demodulator 130 demodulates theoptical signal 24 and passes the demodulated electrical signal to thedata estimator 132. The data estimator 132 processes the electricalsignal for making a best estimate of the original input data and issuesits best estimated input data as output data. The BER detector 138estimates a BER for the output data. The BER may be used as signalquality data. The demodulator 130 uses the signal quality data throughthe algorithms 133, 164 and 192.

The demodulator 130 includes a signal processor 134, a detectorapparatus 135, a combiner 136 and a transfer free spectral range (FSR)phase controller 137. The signal processor 134 includes an opticalsignal processor 134A and an electrical signal processor 134B. Theoptical signal processor 134A receives the optical input signal 24 at aninput signal port 142; separates the signal 24 into optical constructiveand destructive interference signals; differentially demodulates thesignal 24 with the differential time Y; and issues signals fromconstructive and destructive output ports 143A and 144A, respectively,to the detector apparatus 135.

The detector apparatus 135 converts the modulations on the opticalconstructive and destructive path signals to electrical signals andpasses the electrical signals to the electrical signal processor 134B.The electrical signal processor 134B processes the electrical signalsand issues the processed electrical signals at constructive anddestructive output ports 143B and 144B, respectively, to the combiner136. The combiner 136 takes a difference between the instantaneoussignal level of the constructive path signal and the instantaneoussignal level of the destructive path signal for providing the basebandsignal. In a variation of the receiver 120, the data estimator 132connects to the ports 143B and 144B for receiving differentialelectrical signals.

The optical signal processor 134A includes a delay line interferometer(DLI) 150 and an optical imbalancer 152. The electrical signal processor134B includes an electrical imbalancer 156. The DLI 150 has an inputport 165 connected to the input port 142 of the demodulator 130 forreceiving the signal 24. The constructive transfer function of the DLI150 between the input port 165 and its constructive output port 166includes the transfer function G(ƒ) of the equation 1. The destructivetransfer function of the DLI 150 between the input port 165 and itsdestructive output port 168 includes the transfer function H(ƒ) of theequation 2.

The constructive transfer function of the signal processor 134 betweenthe input port 142 and the constructive output port 143B includes theconstructive transfer function of the DLI 150 and the transfer functionsin the constructive signal path of the optical imbalancer 152, thedetector apparatus 135 and the electrical imbalancer 156. Similarly, thedestructive transfer function of the signal processor 134 between theinput port 142 and the destructive output port 144B includes thedestructive transfer function of the DLI 150 and the transfer functionsin the destructive signal path of the optical imbalancer 152, thedetector apparatus 135 and the electrical imbalancer 156.

The signals at the constructive and destructive output ports 166 and 168may be created with optical interference by separating the input signalat the port 165 into two paths and then recombining the signals. The DLI150 has a first signal delay element referred to as a transfer freespectral range (FSR) bandwidth element 148 and a second signal delayelement referred to as a transfer (FSR) phase element 146. The FSR phaseelement 146 provides a delay difference between the signal transit timesin the signal paths in the DLI 150 and also provides a transfer functionphase shift Φ to the constructive and destructive free spectral rangetransfer functions for the DLI 150. The FSR bandwidth element 148provides a signal delay Z (FIGS. 6A-C) between the signal transit timesin the signal paths in the DLI 150.

The signal delay Z provided by the FSR bandwidth element 148 is calledan FSR delay to distinguish it from the signal delay difference providedby the FSR phase element 146 called an FSR phase delay. The readershould be aware that two different types of phases are being describedhere—the phases of the periodic signals and the phases of the periodictransfer functions G(ƒ) and H(ƒ). The FSR delay Z is a major contributorto the signal transit time difference Y for differentially demodulatingthe input signal 24. It should be noted that for the receiver 120, thetime difference Y will not, in general, be the same as the symbol time Tof the modulated signal 24. In a typical system 10, the time differenceY of the receiver 120 is less than about 83% of the symbol time T.

The inverse of the time difference Y defines the free spectral range(FSR) and the bandwidth of the constructive and destructive transferfunctions of the DLI 150. The free spectral range of the DLI 150determines or is a contributor to the constructive and destructivetransfer functions G(ƒ) and H(ƒ) for the DLI 150. The FSR delay Z of theFSR bandwidth element 148 is selected or adjusted based on known ormeasured characteristics of the link 16 to provide the time difference Ythat provides a desired free spectral range (FSR) for the DLI 150 forimproving the performance of the system 10, and especially for reducingthe signal quality degradation due to intersymbol interference (ISI)caused by the filters 26. The bandwidth (FSR) control algorithm 133calculates or provides feedback for determining or controlling theelement 148 as shown in the chart of FIG. 10. In some embodiments theFSR bandwidth element 148 and the FSR phase element 146 may be combinedas a single element having a large delay Z having a small adjustablerange for providing the phase shift Φ.

The FSR phase element 146 is used for fine tuning the phase Φ of thecyclic frequency response of the transfer functions G(ƒ) and H(ƒ) totune the transfer functions G(ƒ) and H(ƒ) relative to the carrierfrequency of the modulated input signal 24. In general, the FSR phasemust be re-adjusted each time a new FSR delay Z is selected or adjusted.The FSR phase element 146 may be controlled by a mechanism 174 includedin the DLI 150 where the mechanism 174 is controlled by the FSR phasecontroller 137. The mechanism 174 may be an oven for controlling thetemperature of the element 146.

The receiver 120 may include an input optical filter for filtering theoptical signal 24 into a channel when the optical signal 24 has multiplechannels that are wavelength division multiplexed (WDM). The inputoptical filter may be viewed as one of the filters 26 in the link 16. Itis desirable for cost and convenience that the same processor 134, andthe same DLI 150 be used for any channel.

In an exception to the general rule stated above, the FSR phasecontroller 137 and FSR phase element 146 may not be necessary when theFSR bandwidth element 148 is selected for providing the time differenceY exactly equal to the inverse of the frequency spacing of the channels.For example, for a channel spacing of 50 GHz and a symbol time of 23picoseconds, the time difference Y might be 20 picoseconds. However, inthis special case, the FSR of the DLI 150 may not be optimized for bestBER. In the receiver 120, the FSR bandwidth element 148 is selectedaccording to criteria of compensating for ISI in the transmission link16 for providing the transit time difference Y and the FSR for best BERwhere the time difference Y is not the inverse of the channel spacing.

The optical imbalancer 152 includes constructive and destructivevariable gain elements 176 and 178 for controlling the optical gainsthat are applied to the signals from the output ports 166 and 168,respectively, in order to provide a gain imbalance between theconstructive and destructive signals to the output ports 143A and 144A.The gains of the elements 176 and 178 may be controlled by the imbalancecontrol algorithm 164 for varying the ratio of the power gains forconstructive and destructive paths for providing constructive anddestructive transfer functions g_(o)(ƒ) and h_(o)(ƒ) according torespective equations 3 and 4. In the equations 3 and 4, the optical gainimbalance, shown with symbol β_(o), varies from minus one to plus one.

g _(o)(ƒ)=1−β_(o)  (3

h _(o)(ƒ)=1+β_(o)  (4

The imbalance operation may be provided dynamically in a closed loopusing active feedback for minimizing the BER from the BER detector 138.Or, the imbalance operation may be “set and forget” (until it is set andforgotten again) after measuring the BER. Or, the imbalance operationmay be open loop based on calculations from known or measuredcharacteristics of the link 16. The calculations are shown in a FIG. 11that is described below. The gain elements 176 and 178 may use variableamplification or variable attenuation for providing the gain ratio. Onlyone of the gain elements 176 and 178 is required to be variable in orderto provide the variable gain ratio.

The detector apparatus 135 includes a constructive photo-detector 182and a destructive photo-detector 184 for detecting the optical signalsfor the ports 143A and 144A, respectively, by converting photons toelectrons for providing electrical signals to the electrical imbalancer156. Photodiodes may be used for the detectors 182 and 184. Eachphotodiode 182 and 184 produces an electrical signal proportional todetected optical power. The constructive and destructive transferfunctions from the input port 165 to the electrical outputs of thedetector apparatus 135 include the terms of respective equations 5 and6.

G(f)*g _(o)(ƒ)={[1+cos(2πfY)]/2}*(1−β_(o))  (5

H(f)*h _(o)(ƒ)={[1−cos(2πfY)]/2)}*(1+β_(o))  (6

The FSR phase controller 137 controls the phase delay of the FSR phaseelement 146 for maximizing a ratio of the optical powers in theconstructive and destructive detectors 182 and 184. In a preferredembodiment, FSR phase controller 137 includes a detector 145 for makinga power-related measurement for the signals in the constructive anddestructive signal paths. The detector 145 measures and then averagesthe optical powers in the constructive and destructive detectors 182 and184 by measuring photocurrents A_(C) and A_(D), respectively. Thephotocurrents are the electrical currents in the detectors 182 and 184that result from the conversions of photons to electrons. Thephotocurrents are measured by measuring the electrical currents passingthrough the detectors 182 and 184 and then averaging to remove highfrequency components. The high frequency components can be removed withlow pass electrical filters with passbands lower than the bandwidth ofthe optical modulation.

An algorithm in the FSR phase controller 137 controls the phase delay ofthe FSR phase element 146 in order to maximize a ratio, difference ornormalized difference of the transfer functions. The normalizeddifference is the difference between the constructive and destructivesignal path power-related measurements divided by the sum of theconstructive and destructive signal path power-related measurement. TheFSR phase controller 137 may be constructed in order to maximize thenormalized difference ΔB measured from the average photocurrents asshown in an equation 7.

ΔB=(A _(C) −A _(D))/(A _(C) +A _(D))  (7

The receiver 120 may also include a path for signal quality feedback192. Data for signal quality is processed through the signal qualityfeedback 192 and passed to the FSR phase controller 137. The FSR phasecontroller 137 uses the processed signal quality data for fine tuningthe phase delay of the FSR phase element 146 in order to improve andoptimize the signal quality. Preferably, the FSR phase element 146 isfirst tuned in a feedback loop for maximizing a constructive-destructivenormalized power difference and then fine tuned for minimizing a biterror ratio (BER). The signal quality data may be obtained by measuringBER directly, by measuring an eye opening ratio of a baseband signaland/or by measuring a signal to noise ratio (SNR) of the optical orelectrical constructive and destructive path signals.

The electrical imbalancer 156 includes constructive and destructivevariable gain elements 186 and 188 for controlling the electrical gainsapplied to the signals from the constructive and destructive detectors182 and 184, respectively, and issuing signals from output ports 143Band 144B. The gains of the elements 186 and 188 may be controlled by theimbalance control algorithm 164 for varying the ratio of the gains forconstructive and destructive paths for providing constructive anddestructive transfer functions g_(e)(ƒ) and h_(e)(ƒ) according torespective equations 8 and 9. In the equations 8 and 9, the electricalgain imbalance, shown with symbol β_(e), varies from minus one to plusone.

g _(e)(ƒ)=1−β_(e)  (8

h _(e)(ƒ)=1+β_(e)  (9

The imbalance operation may be provided dynamically in a closed loopusing active feedback for minimizing the BER from the BER detector 138.Or, the imbalance operation may be “set and forget” (until it is set andforgotten again) after measuring the BER. Or, the imbalance operationmay be open loop provided based on calculations from known or measuredcharacteristics of the link 16. The calculations are shown in a FIG. 11that is described below. The gain elements 186 and 188 may use variableamplification or variable attenuation for providing the gain ratio. Onlyone of the gain elements 186 and 188 is required to be variable in orderto provide the variable gain ratio.

The combiner 136 takes the difference between the electrical signalsfrom the constructive and destructive output ports 143B and 144B andpasses the difference as a baseband signal to the data estimator 132.The baseband signal is the demodulated signal corresponding to the inputsignal 24.

The baseband signal has instantaneous signal levels that in a systemwith no degradation would be exactly representative of the input data atsample times synchronized to a data clock. For example at the sampletimes, one signal level would represent a logical “1” and another signallevel would represent a logical “0” for the input data. However, varioussignal degradations, especially intersymbol interference (ISI) due tothe filters 26 in the link 16, cause the signal levels of the basebandsignal at the sample times to have many levels and occasionally evenhave levels where a “1” appears to be a “0” and vice versa. The basebandsignal synchronized to the data clock and shown over and over again onthe same display appears as an eye diagram where the opening of the eyeis a measure of the quality of the demodulated signal.

The data estimator 132 recovers frame and data clock signals and useserror detection and correction techniques for making its best estimateof the input data. Its best estimate of the input data is issued asoutput data. The BER detector 138 uses error detection and correctioninformation from the date estimator 132 and/or programmed knowledge ofexpected data bits in the output data for estimating a bit error ratio(BER). For dynamic operation, the BER detector 138 passes the BER to theimbalance control algorithm 164 in the demodulator 130. The function ofthe BER detector 138 for providing BER measurements or feedback may bereplaced or augmented with a device for measuring the signal quality ofthe baseband signal. The signal quality device and/or measurement may beinternal to the receiver 120 or external. Test equipment may be used asan external device for measuring signal quality or BER.

A side effect of changing the selection of the FSR delay Z is that thetransfer function phase or FSR phase of the transfer functions G(ƒ) andH(ƒ) may slide many cycles with respect to the frequency of the inputsignal 24. In a general rule, whenever the FSR delay is changed, thetransfer function phase shift Φ, or phase shifts Φ_(G) and Φ_(H), mustbe re-adjusted by the transfer (FSR) phase controller 137 by adjustingthe FSR phase element 146 for re-tuning the transfer functions G(ƒ) andH(ƒ) to the frequency of the input optical signal 24. On the other handthe effect of changing the phase shift Φ, or phase shifts Φ_(G) andΦ_(H), on the FSR bandwidth is so small that it is insignificant

The receiver 20,120 includes a microprocessor system for operating thereceiver 20,120 according to instructions stored in a memory. Theseinstructions include the above described bandwidth (FSR) controlalgorithm 33,133, the imbalance control algorithm 64,164 and the signalquality feedback 92,192. Signal quality for the receiver 20,120 may bedefined in terms of BER, ISI, eye opening ratio, and/or signal to noiseratio (SNR). Typically the minimum BER, the best compensation for ISI,the largest eye openings and the highest signal to noise ratios (SNR)sof the optical and electrical constructive and destructive path signalsare optimized, or nearly optimized, for the same selections andadjustments within the receiver 20,120. The algorithm 192 may operate ina feedback loop for minimizing BER.

FIG. 6A illustrates a delay line interferometer (DLI) 150A as anembodiment of the DLI 150. Elements associated with the DLI 150A thatare analogous to elements associated with the DLI 150 are denoted byappending the reference identification numbers with the letter “A”. TheDLI 150A includes structural elements for an input port 165A, a transfer(FSR) phase element 146A, a mechanism or oven 174A, a partiallyreflecting first mirror 202A, a second mirror 204A, a third mirror 208A,and constructive and destructive output ports 166A and 168A.

The structural elements of DLI 150A are disposed as follows. The inputoptical signal 24 illuminates the front side of the partially reflectingfirst mirror 202A. The first mirror 202A is set at an angle to the pathof the optical signal 24 so that part of the signal 24 is reflected as asignal 212A and part of the signal 24 is passed through as a signal214A. The signal 212A is reflected from the second mirror 204A as asignal 216A back to the front side of the first mirror 202A. The signal214A illuminates the element 146A and emerges after a fine tune phasedelay as a signal 218A. The signal 218A reflects from the third mirror208A as a signal 222A.

The signal 222A illuminates the element 146A and emerges after the phasedelay as a signal 224A. The signal 224A illuminates the back side of thefirst mirror 202A. Part of the signal 224A is reflected from the backside of the first mirror 202A to combine with part of the signal 216Apassed through the front side of the first mirror 202A for providing asignal 226A at the constructive output port 166A. Part of the signal224A passes through the back side of the first mirror 202A to combinewith part of the signal 216A reflected from the front side of the firstmirror 202A for providing a signal 228A at the destructive output port168A.

The elements of the DLI 150A split the input signal 24 into a first path232A and a second path 234A. The transit time of the first path 232A isthe sum of the transit times of the signals 212A and 216A. The transittime of the second path 234A is the sum of the transit times of thesignals 214A, 218A, 222A and 224A plus two times the phase delay of theelement 146A. The difference between the first and second path transittimes is the differential transit time Y that is used for demodulationof the input optical signal 24. The time Y is fine tuned by adjustingthe signal phase delay in the element 146A in order to adjust the FSRphase of the DLI 150A for adjusting the transfer function phase of theconstructive and destructive transfer functions G(ƒ) and H(ƒ) (see FIG.2).

The material for the element 146A is selected to have an optical indexthat depends upon temperature. The FSR phase controller 137A provides acontrol signal to adjust the temperature of the oven 174A in order tofine tune the delay of the element 146A for centering the constructiveand destructive transfer functions G(ƒ) and H(ƒ) of the DLI 150A on theoptical carrier frequency of the input optical signal 24.

FIG. 6B illustrates a delay line interferometer (DLI) 150B as anembodiment of the DLI 150. Elements associated with the DLI 150B thatare analogous to elements associated with the DLI 150 are denoted byappending the reference identification numbers by the letter “B”. TheDLI 150B includes structural elements for an input port 165B, a transferFSR bandwidth element 148B, a transfer (FSR) phase element 146B, amechanism or oven 174B, a partially reflecting first mirror 202B, asecond mirror 204B, a third mirror 208B, and constructive anddestructive output ports 166B and 168B.

The structural elements of DLI 150B are disposed as follows. The inputoptical signal 24 illuminates the front side of the partially reflectingfirst mirror 202B. The first mirror 202B is set at an angle to the pathof the optical signal 24 so that part of the signal 24 is reflected as asignal 212B and part of the signal 24 is passed through as a signal214B. The signal 212B is reflected from the second mirror 204B as asignal 216B back to the front side of the first mirror 202B. The signal214B illuminates the element 148B and emerges after the delay Z as asignal 217B. The signal 217B illuminates the element 146B and emergesafter a fine tune phase delay as a signal 218B. The signal 218B reflectsfrom the third mirror 208B as a signal 222B.

The signal 222B illuminates the element 146B and emerges after the phasedelay as a signal 223B. The signal 223B illuminates the element 148B andemerges after the delay Z as a signal 224B. The signal 224B illuminatesthe back side of the first mirror 202B. Part of the signal 224B isreflected from the back side of the first mirror 202B to combine withpart of the signal 216B passed through the front side of the firstmirror 202B for providing a signal 226B at the constructive output port166B. Part of the signal 224B passes through the back side of the firstmirror 202B to combine with part of the signal 216B reflected from thefront side of the first mirror 202B for providing a signal 228B at thedestructive output port 168B.

The elements of the DLI 150B split the input signal 24 into a first path232B and a second path 234B. The transit time of the first path 232B isthe sum of the transit times of the signals 212B and 216B. The transittime of the second path 234B is the sum of the transit times of thesignals 214B, 217B, 218B, 222B, 223B and 224B plus two times the phasedelay of the element 146B plus two times the delay Z. The differencebetween the first and second path transit times is the differentialtransit time Y that is used for demodulation of the input optical signal24. The FSR delay Z is a part of the transit time difference Y. Abandwidth (FSR) control algorithm 133B (FIG. 10) provides a calculationor control signal for providing the time Y by selecting or adjusting thedelay Z of the element 148B in order to select or adjust the FSR and thebandwidths of the constructive and destructive transfer functions G(ƒ)and H(ƒ) (FIG. 2) for the DLI 150B.

The material for the element 146B is selected to have an optical indexthat depends upon temperature. The FSR phase controller 137B provides acontrol signal to adjust the temperature of the oven 174B in order tofine tune the delay of the element 146B for centering the constructiveand destructive transfer functions G(ƒ) and H(ƒ) (FIG. 2) of the DLI150B on the optical carrier frequency of the input optical signal 24.

FIG. 6C illustrates a delay line interferometer (DLI) 150C as anembodiment of the DLI 150. Elements associated with the DLI 150C thatare analogous to elements associated with the DLI 150 are denoted byappending the reference identification numbers by the letter “C”. TheDLI 150C includes structural elements for an input port 165C, a combinedtransfer FSR bandwidth element and phase element 148C,146C, a mechanismor oven 174C, a partially reflecting first mirror 202C, a second mirror204C, a third mirror 208C, and constructive and destructive output ports166C and 168C.

The structural elements of DLI 150C are disposed as follows. The inputoptical signal 24 illuminates the front side of the partially reflectingfirst mirror 202C. The first mirror 202C is set at an angle to the pathof the optical signal 24 so that part of the signal 24 is reflected as asignal 212C and part of the signal 24 is passed through as a signal214C. The signal 212C is reflected from the second mirror 204C as asignal 216C back to the front side of the first mirror 202C. The signal214C illuminates the element 148C,146C and emerges after the delay Z andan adjustment by the fine tune phase delay as a signal 218C. The signal218C reflects from the third mirror 208C as a signal 222C.

The signal 222C illuminates the element 148C,146C and emerges after thedelay Z and an adjustment by the phase delay as a signal 224C. Thesignal 224C illuminates the back side of the first mirror 202C. Part ofthe signal 224C is reflected from the back side of the first mirror 202Cto combine with part of the signal 216C passed through the front side ofthe first mirror 202C for providing a signal 226C at the constructiveoutput port 166C. Part of the signal 224C passes through the back sideof the first mirror 202C to combine with part of the signal 216Creflected from the front side of the first mirror 202C for providing asignal 228C at the destructive output port 168C.

The elements of the DLI 150C split the input signal 24 into a first path232C and a second path 234C. The transit time of the first path 232C isthe sum of the transit times of the signals 212C and 216C. The transittime of the second path 234C is the sum of the transit times of thesignals 214C, 218C, 222C and 224C plus two times the delay Z with theadjustment of the phase delay of the element 148C,146C. The differencebetween the first and second path transit times is the differentialtransit time Y that is used for demodulation of the input optical signal24. The FSR delay Z is a part of the transit time difference Y. Abandwidth (FSR) control algorithm 133C (FIG. 10) provides a calculationor control signal for providing the time Y by selecting or adjusting thedelay Z of the element 148C,146C in order to select or adjust the FSRand the bandwidths of the constructive and destructive transferfunctions G(ƒ) and H(ƒ) (FIG. 2) for the DLI 150C.

The material for the element 148C,146C is selected to have an opticalindex that depends upon temperature. The FSR phase controller 137Cprovides a control signal to adjust the temperature of the oven 174C inorder to fine tune the phase delay of the element 146C for centering theconstructive and destructive transfer functions G(ƒ) and H(ƒ) (FIG. 2)of the DLI 150C on the optical carrier frequency of the input opticalsignal 24.

FIG. 6D illustrates a delay line interferometer (DLI) 150D as anembodiment of the DLI 150 having discrete steps for free spectral range.Elements of the DLI 150D that are analogous to elements of the DLI 150are denoted by appending the reference identification numbers by theletter “D”. The DLI 150D includes a transfer FSR bandwidth element 148D.The transfer FSR bandwidth element 148D, also known as the delay element148D, has a stair step cross section. The element 148D is positionablefor providing discrete fixed steps for the delay Z by positioning theelement 148D with respect to signals within the DLI 150E.

The DLI 150D includes an input port 165D, a transfer (FSR) phase element146D, the positionable delay element 148D, a mechanism or oven 174D, apositioning device 175D, a partially reflecting first mirror 202D, asecond mirror 204D, a third mirror 208D, and constructive anddestructive output ports 166D and 168D disposed as follows. The inputoptical signal 24 illuminates the front side of the partially reflectingfirst mirror 202D. The first mirror 202D is set at an angle to the pathof the optical signal 24 so that part of the signal 24 is reflected as asignal 212D and part of the signal 24 is passed through as a signal214D. The signal 212D is reflected from the second mirror 204D as asignal 216D back to the front side of the first mirror 202D. The signal214D illuminates the element 148D and emerges after the FSR delay Z as asignal 217D. The signal 217D illuminates the element 146D and emergesafter an adjustable fine tuning delay as a signal 218D. The signal 218Dreflects from the third mirror 208D as a signal 222D.

The signal 222D illuminates the element 146D and emerges after the phasedelay as a signal 223D. The signal 223D illuminates the element 148D andemerges after the FSR delay Z as a signal 224D. The signal 224Dilluminates the back side of the first mirror 202D. Part of the signal224D is reflected from the back side of the first mirror 202D to combinewith part of the signal 216D passed through the front side of the firstmirror 202D for providing a signal 226D at the constructive output port166D. Part of the signal 224D passes through the back side of the firstmirror 202D to combine with part of the signal 216D reflected from thefront side of the first mirror 202D for providing a signal 228D at thedestructive output port 168D. Typically, the elements 148D and 146D havebulk optical group indices (time delay equals group index multiplied bydistance divided by the speed of light in a vacuum) that are muchgreater than the group indices experienced by the signals 212D, 216D,214D, 217D, 218D, 222D, 223D and 224D outside of the elements 148D and146D.

The elements of the DLI 150D split the input signal 24 into a first path232D and a second path 234D. The transit time of the first path 232D isthe sum of the transit times of the signals 212D and 216D. The transittime of the second path 234D is the sum of the transit times of thesignals 214D, 217D, 218D, 222D, 223D and 224D plus two times theadjustable delay of the element 146D plus two times the FSR delay Z ofthe element 148D. The difference between the first and second pathtransit times is the differential transit time Y that is used fordemodulation of the input optical signal 24. Either or both of theelements 146D and 148D may be constructed in two pieces, one in thesignal path 232D and one in the signal path 234D, for providing a signaldelay that is the difference between the signal delays of the twoelement pieces.

The element 148D has a stair step cross section having two or more stairrisers 242D and stair treads 244D. Alternatively, the element 148D mayhave segments having different group indices. The positioning device175D positions the element 148D so that the signal 214D enters theelement 148D at one of the risers 242D and the signal 224D emerges fromthe element 148D at one of the risers 242D. Alternatively, the stairwayis on the opposite side of the element 148D so the signal 223D entersand the signal 217D emerges from the element 148D at one of the risers242D. The delay step sizes are proportional to the physical lengths ofthe treads 244D.

The positioning device 175D stepwise positions the element 148D in adirection approximately perpendicular to the signals 214D, 217D, 223Dand 224D in order to increase or decrease the effective optical lengthof the element 148D in order to increase or decrease the FSR delay Z.The discrete steps of the delay Z provide discrete steps of thedifferential transit time Y, thereby providing discrete steps in the FSRbandwidths of the constructive and destructive transfer functions G(ƒ)and H(ƒ) for the DLI 150D. Discrete steps may be beneficial to provideimmunity to jitter in the position of the element 148D.

A bandwidth (FSR) control algorithm 133D controls the positioning device175D for positioning the element 148D. The control algorithm 133D may beexternal to the receiver 20,120 or included within the receiver 20,120.A technician uses information from the control algorithm 133D to operatethe positioning device 175D or the information from the controlalgorithm 133D is part of a feedback loop for automatic operation of thepositioning device 175D.

The material for the element 146D is selected to have a group index thatdepends upon temperature. The FSR phase controller 137D provides acontrol signal to adjust the temperature of the oven 174D in order tofine tune the delay of the element 146D for centering the constructiveand destructive transfer functions G(ƒ) and H(ƒ) of the DLI 150D on theoptical carrier frequency of the input optical signal 24. The functionsof the transfer phase element 146D and the stepped FSR delay element148D may be combined (as shown in the FIG. 6C for the element 146C and148C) with the use of a material having temperature-dependent groupindex for the element 148D.

FIG. 6E illustrates a delay line interferometer (DLI) 150E as anembodiment of the DLI 150 having a smooth gradient of adjustment forfree spectral range. Elements associated with the DLI 150E that areanalogous to elements associated with the DLI 150 are denoted byappending the reference identification numbers by the letter “E”. TheDLI 150E includes a transfer FSR bandwidth element 148E. The transferFSR bandwidth element 148E, also known as the delay element 148E, has across section having a smooth change or gradient. The element 148E ispositionable for providing a continuous variation of the delay Z bypositioning the element 148E with respect to signals within the DLI150E.

The DLI 150E includes an input port 165E, a transfer (FSR) phase element146E, the positionable delay element 148E, a mechanism or oven 174E, apositioning device 175E, a partially reflecting first mirror 202E, asecond mirror 204E, a third mirror 208E, and constructive anddestructive output ports 166E and 168E disposed as follows. The inputoptical signal 24 illuminates the front side of the partially reflectingfirst mirror 202E. The first mirror 202E is set at an angle to the pathof the optical signal 24 so that part of the signal 24 is reflected as asignal 212E and part of the signal 24 is passed through as a signal214E. The signal 212E is reflected from the second mirror 204E as asignal 216E back to the front side of the first mirror 202E. The signal214E illuminates the element 148E and emerges after the FSR delay Z as asignal 217E. The signal 217E illuminates the element 146E and emergesafter an adjustable fine tuning delay as a signal 218E. The signal 218Ereflects from the third mirror 208E as a signal 222E.

The signal 222E illuminates the element 146E and emerges after the phasedelay as a signal 223E. The signal 223E illuminates the element 148E andemerges after the FSR delay Z as a signal 224E. The signal 224Eilluminates the back side of the first mirror 202E. Part of the signal224E is reflected from the back side of the first mirror 202E to combinewith part of the signal 216E passed through the front side of the firstmirror 202E for providing a signal 226E at the constructive output port166E. Part of the signal 224E passes through the back side of the firstmirror 202E to combine with part of the signal 216E reflected from thefront side of the first mirror 202E for providing a signal 228E at thedestructive output port 168E. Typically, the elements 148E and 146E havebulk group indices that are much greater than the group indicesexperienced by the signals 212E, 216E, 214E, 217E, 218E, 222E, 223E and224E outside the delay elements 148E and 146E.

The elements of the DLI 150E split the input signal 24 into a first path232E and a second path 234E. The transit time of the first path 232E isthe sum of the transit times of the signals 212E and 216E. The transittime of the second path 234E is the sum of the transit times of thesignals 214E, 217E, 218E, 222E, 223E and 224E plus two times theadjustable delay of the element 146E plus two times the FSR delay Z ofthe element 148E. The difference between the first and second pathtransit times is the differential transit time Y that is used fordemodulation of the input optical signal 24. Either or both of theelements 146E and 148E may be constructed in two pieces, one in thesignal path 232E and one in the signal path 234E, for providing a signaldelay that is the difference between the signal delays of the twoelement pieces.

The element 148E has a cross section having a smooth change or gradientof physical length in order to provide a continuously variable opticaldelay. Alternatively, the element 148E may have a smooth gradient ofoptical group index. The positioning device 175E moves the element 148Ein a direction perpendicular to the signals 214E, 217E, 223E and 224E inorder to increase or decrease the effective optical length of theelement 148E in order to increase or decrease the FSR delay Z. Thecontinuously variable FSR delay Z provides a continuously variabledifferential transit time Y, thereby providing a smooth, continuouslyvariable FSR bandwidth for the constructive and destructive transferfunctions G(ƒ) and H(ƒ) for the DLI 150E.

A bandwidth (FSR) control algorithm 133E controls the positioning device175E for positioning the element 148E. The control algorithm 133E may beexternal to the receiver 20,120 or included within the receiver 20,120.A technician uses information from the control algorithm 133E to operatethe positioning device 175E or the information from the controlalgorithm 133E operates the positioning device 175E automatically tomove the element 148E more or less perpendicular to the optical signals214E, 217E, 223E and 224E.

The material for the element 146E is selected to have an optical groupindex that depends upon temperature. The FSR phase controller 137Eprovides a control signal to adjust the temperature of the oven 174E inorder to fine tune the delay of the element 146E for centering theconstructive and destructive transfer functions G(ƒ) and H(ƒ) of the DLI150E on the optical carrier frequency of the input optical signal 24.

The elements 148E and 146E may be combined (as shown in FIG. 6C for theelements 146C and 148C) into a single element having an effectiveoptical length for providing the FSR delay Z of the element 148E and thefine tuned FSR phase adjustment of the element 146E. Further, the devicepositioner 175E may provide the fine phase delay control by finelypositioning the element 148E.

FIG. 6F illustrates a delay line interferometer (DLI) 150F as anembodiment of the DLI 150 having a movable mirror 208F for selection oradjustment of free spectral range. Elements associated with the DLI 150Fthat are analogous to elements associated with the DLI 150 are denotedby appending the reference identification numbers by the letter “F”. Themovable mirror 208F acts as a transfer FSR bandwidth element byproviding a selectable optical length in a signal path in the DLI 150F.The adjustment in the optical length provides control of the freespectral range of the DLI 150F by controlling the delay Z between thetwo signal paths in the DLI 150F. The delay Z is selected by selecting aposition 246F of the mirror 208F with respect to the signal path.

The DLI 150F includes an input port 165F, a transfer (FSR) phase element146F, a mechanism or oven 174F, a positioning device 175F, a partiallyreflecting first mirror 202F, a second mirror 204F, the movable thirdmirror 208F, and constructive and destructive output ports 166F and 168Fdisposed as follows. The input optical signal 24 illuminates the frontside of the partially reflecting first mirror 202F. The first mirror202F is set at an angle to the path of the optical signal 24 so thatpart of the signal 24 is reflected as a signal 212F and part of thesignal 24 is passed through as a signal 214F. The signal 212F isreflected from the second mirror 204F as a signal 216F back to the frontside of the first mirror 202F. The signal 214F illuminates the element146F and emerges after a fine tune signal delay as a signal 218F. Thesignal 218F passes through the delay Z to reflect from the third mirror208F as a signal 222F.

The signal 222F passes through the delay Z to illuminate the element146F and emerges after the phase delay as a signal 224F. Part of thesignal 224F is reflected from the back side of the first mirror 202F tocombine with part of the signal 216F passed through the front side ofthe first mirror 202F for providing a signal 226F at the constructiveoutput port 166F. Part of the signal 224F passes through the back sideof the first mirror 202F to combine with part of the signal 216Freflected from the front side of the first mirror 202F for providing asignal 228F at the destructive output port 168F. Typically, the element146F has a group index much greater than the group indices experiencedby the signals 212F, 216F, 214F, 218F, 222F and 224F outside the delayelement 146F.

The elements of the DLI 150F split the input signal 24 into a first path232F and a second path 234F. The transit time of the first path 232F isthe sum of the transit times of the signals 212F and 216F. The transittime of the second path 234F is the sum of the transit times of thesignals 214F, 218F, 222F and 224F plus two times the phase delay of theelement 146F plus two times the FSR delay Z of the mechanical lengthadjustment of the movable mirror 208F. The difference between the firstand second path transit times is the differential transit time Y that isused for demodulation of the input optical signal 24. The element 146Fmay have one piece in the signal path 232F and one piece in the signalpath 234F for fine tuning a signal delay that is the difference betweenthe signal delays in the two paths 232F and 234F. Either or both of themirror 204F and 208F may be constructed as moving mirrors having aselectable position 246F.

The positioning device 175F moves the mirror 208F in the direction ofthe signals 218F and 222F in order to increase or decrease the effectiveoptical length between the signal paths 232F and 234F of the DLI 150F inorder to increase or decrease the FSR delay Z. The continuously variableFSR delay Z provides a continuously variable differential transit timeY, thereby providing a smooth, continuously variable FSR bandwidth forthe constructive and destructive transfer functions G(ƒ) and H(ƒ) forthe DLI 150F.

A bandwidth (FSR) control algorithm 133F controls the positioning device175F for positioning the mirror 208F. The control algorithm 133F may beexternal to the receiver 20,120 or included within the receiver 20,120.A technician uses information from the control algorithm 133F to operatethe positioning device 175F or the information from the controlalgorithm 133F operates the positioning device 175F automatically tomove the element 148F to shorten or lengthen the distance traveled bythe optical signals 218F and 222F. The positioning device 175F may beconstructed in a manner similar to the construction described below forthe positioning device 175D.

The material for the element 146F is selected to have an optical groupindex that depends upon temperature. The FSR phase controller 137Fprovides a control signal to adjust the temperature of the oven 174F inorder to fine tune the delay of the element 146F for centering theconstructive and destructive transfer functions G(ƒ) and H(ƒ) of the DLI150F on the optical carrier frequency of the input optical signal 24.The movable mirror 208F may combine the functions for selecting the FSRdelay Z and fine tuning the FSR phase.

FIG. 7 is a simplified flow chart of a method of the present inventionfor receiving a differential phase shift keyed (DPSK) optical signaltransmitted through a transmission link channel. One or any combinationof these steps may be stored on a tangible medium 300 in acomputer-readable form as instructions to a computer for carrying outthe steps.

In a step 301 constructive and destructive transfer functions arecalculated, looked up in a table based on calculations, or activelytuned for minimizing the effect of intersymbol interference (ISI) forimproving signal quality. The transfer functions may be implemented byselecting a delay Z in a signal path of a delay line interferometer(DLI) in order to select the free spectral range (FSR) of the DLI. Thedelay Z contributes to a differential time Y, in general not equal to aDPSK symbol time T, for providing differential demodulation. The signalquality may be determined in terms of bit error ratio (BER) for outputdata. In a first embodiment the delay Z is selected by dynamicallyadjusting the delay Z with feedback from a signal quality measurement inorder to minimize the BER. In a second embodiment the delay Z isselected by trial and error in order to minimize a measured BER. In athird embodiment the delay Z is selected based upon a BER measurement onanother optical transmission link channel where the other channel isknown to have the same channel bandwidth. In a fourth embodiment thedelay Z is selected by calculating from a known channel or spectrumbandwidth. In a fifth embodiment the delay Z is selected from a tablehaving calculations based on channel bandwidth or spectrum forminimizing BER. The calculations for FSR are shown in the chart of FIG.10. Signal quality analysis and measurements other than BER, such asmeasurements of eye openings, may be used in place of, or to augment BERdetection for the selection, adjustment or control of the delay Z. Theuser should be aware that the receiver 20 may lose lock on the inputsignal 24 when a new FSR delay Z is selected.

In a step 302 an optical gain imbalance between constructive anddestructive output port signals is selected (as described above for theFSR delay Z) for best signal quality. The calculations for gainimbalance are shown in FIG. 11. The signal quality may be determined asdescribed above.

In a step 303 the phase of the constructive and destructive transferfunctions is adjusted for maximizing the signal power difference betweenoptical constructive and destructive path signals. The transfer functionphases may be adjusted as FSR phases while the system is in operationfor providing output data without overly degrading the output data byfine tuning the delay of a signal delay element in a signal path in theDLI. Optionally, the FSR phase is further tuned for best signal quality.The FSR phase adjustment tunes the constructive and destructive transferfunctions relative to the carrier frequency of the input optical signal.

FIG. 8 is a flow chart of a method of the present invention using acalculated FSR and a calculated gain imbalance for receiving adifferential phase shift keyed (DPSK) optical signal transmitted througha transmission link channel. Any one or more of these steps may bestored on a tangible medium 310 in a computer-readable form asinstructions that may be read by a computer for carrying out the steps.The reader may refer to the descriptions of the system 10 and opticalreceivers 20 and 120 for further details of the following steps.

Either during design, test or installation in a step 320 a free spectralrange (FSR) of a delay line interferometer (DLI) is calculated based oncharacteristics, particularly the bandwidth of the link 16, for thetransmission system 10 for obtaining the best signal quality and/orlowest bit error ratio (BER). In a step 322 optical and/or electricalgain imbalances are calculated based on the FSR of the DLI, the symbolrate R, and the characteristics of the transmission system 10,particularly the bandwidth of the filters 26, for obtaining the bestsignal quality and/or lowest bit error ratio (BER).

In operation the receiver 20,120 receives the modulated input signal 24in a step 324. In a step 330 the DLI having the pre-calculated FSRdifferentially decodes the signal 24 and uses optical interference forseparating the signal into constructive and destructive signal paths. Ina step 332 the FSR phase is adjusted for tuning the FSR transferfunctions relative to the carrier of the signal 24. In a step 334 theoptical gain imbalance is applied to the signals in the constructive anddestructive signal paths for providing optical constructive anddestructive signal outputs.

The modulations of the signals at the optical constructive anddestructive signal outputs are converted to electrical signals in a step336. In a step 338 the electrical gain imbalance is applied to thesignals in the constructive and destructive signal paths for providingelectrical constructive and destructive signal outputs.

Power-related measurements are detected in a step 342 for the signals atthe constructive and destructive signal outputs. When the gain imbalanceis applied to the electrical signals, the electrical output signals aremeasured. When the gain imbalance is applied to the optical signals butnot the electrical signals, either the optical or the electrical outputsignals may be measured. In one embodiment, the gain is applied to theoptical signals and the power-related detections are measurements of theaverage photocurrents for converting the optical modulation toelectrical signals. In a step 344 a normalized difference between thepower-related measurements is applied to adjust the FSR phase for thestep 332. In a step 352 the electrical constructive and destructive pathsignals are combined by taking the difference of the signals. Thedifference is issued as a baseband signal. Finally, in a step 354 theinput data from the transmitter 12 is estimated from the baseband signalfor providing output data.

FIG. 9 is a flow chart of a dynamic method of the present inventionwhere the FSR and the gain imbalance are adjusted according to BER forreceiving a differential phase shift keyed (DPSK) optical signaltransmitted through a transmission link channel while attempts are beingmade for transmitting data through the system 10. Any one or more ofthese steps may be stored on a tangible medium 360 in acomputer-readable form as instructions that may be read by a computerfor carrying out the steps. The reader may refer to the descriptions ofthe system 10 and optical receivers 20 and 120 for further details ofthe following steps. It should be noted that the data may requireseveral re-transmissions as the receiver 20,120 is being adjusted.

The input signal 24 is received at the start in the step 324. In thestep 330 the DLI differentially decodes the signal 24 and uses opticalinterference for separating the signal into constructive and destructivesignal paths. In the step 332 the FSR phase is adjusted for tuning theFSR transfer functions relative to the carrier of the signal 24. For asymmetrical signal spectrum, the FSR phase is tuned for centering theFSR transfer functions to the carrier of the signal 24. In the step 334the optical gain imbalance is applied to the signals in the constructiveand destructive signal paths for providing optical constructive anddestructive signal outputs.

The modulations of the signals at the optical constructive anddestructive signal outputs are converted to electrical signals in thestep 336. In the step 338 the electrical gain imbalance is applied tothe signals in the constructive and destructive signal paths forproviding electrical constructive and destructive signal outputs.

Power-related measurements are detected in the step 342 for the signalsat the constructive and destructive signal outputs. When the gainimbalance is applied to the electrical signals, the electrical outputsignals are measured. When gain imbalance is applied to the opticalsignals but not the electrical signals, either the optical or theelectrical output signals may be measured. In one embodiment, the gainis applied to the optical signals and the power-related detections aremeasurements of the average photocurrents for converting the opticalmodulation to electrical signals. In the step 344 a normalizeddifference between the power-related measurements is applied to adjustthe FSR phase for the step 332. In a step 352 the electricalconstructive and destructive path signals are combined by taking thedifference of the signals. The difference is issued as a basebandsignal.

The difference of the constructive and destructive electrical signaloutputs is determined in the step 352 for providing a baseband signal.In the step 354 the input data from the transmitter 12 is estimated fromthe baseband signal for providing output data.

A signal quality determined from the optical or electrical signals, or abit error ratio (BER), is measured for the output data in a step 372. Ina step 374, feedback for the signal quality or BER is applied to adjustthe FSR used in the step 330. In a step 376 feedback for the signalquality is applied to adjust the optical and/or gain imbalance for thestep 334. And optionally, in a step 378 feedback for the signal qualityis applied to adjust the FSR phase for the step 332. The steps 330, 332and/or 334 may be iterated until no further improvement in signalquality is detected. Whenever the FSR is changed due to a new selectionor adjustment in the step 330, the FSR phase must be re-tuned in thestep 332.

FIG. 10 is an exemplary chart for the bandwidth (FSR) control algorithms33 and 133 for calculating the optimum FSR for the DLI 150 (FIGS. 4, 5and 6A-C) based on the effective optical bandwidth of the system 10. TheFSR and the bandwidth are normalized to the symbol rate R (the inverseof the symbol time T) of the system 10. It can be seen that the optimumFSR is at least 10% greater than the symbol rate R. It can also be seenthat the optimum FSR is at least 20% greater than the symbol rate R whenthe effective optical bandwidth of the system 10 is less than the symbolrate R. It should be noted that the FSR/R levels of 1, 1.1, 1.2, 1.3,1.4, 1.5, 1.6, 1.7, 1.8, 1.9 and 2 are provided by differentialdemodulation transit times of about 90.9%, 83.3%, 76.9%, 71.4%, 66.7%,62.5%, 58.8%, 55.6%, 52.6% and 50%, respectively, of the symbol time Tfor the modulated optical input signal 24.

FIG. 11 is an exemplary chart for the gain imbalance control algorithms64 and 164 for the calculating the extra gain imbalance to be applied bythe optical imbalancer 152 and/or the electrical imbalancer 156. Thegain imbalance term β is calculated from the FSR for the DLI 150, theeffective optical bandwidth of the system 10, and the symbol rate R ofthe system 10.

FIGS. 12A-E illustrate embodiments of the stepped and smooth gradientdelay elements 148D and 148E, respectively. Signals 400 in a firstdirection 402 traverse the effective optical lengths of the elements148D and 148E. The element 148D has a stepped gradient of effectiveoptical length for providing discrete increments of the delay Z. Theelement 148E has a smooth gradient of effective optical length forproviding the delay Z as a continuously variable quantity.

The elements 148D and 148E are positioned in a second direction 404 bythe positioning devices 175D and 175E for selecting the delay Z forproviding a desired transit time difference Y between the signal paths232D and 234D in the DLI 150D or the signal paths 232E and 234E in theDLI 150E. The second direction 404 is about perpendicular to the firstdirection 402. The term “gradient” denotes the change of signal delay ofthe element 148D, 148E with respect to a change in position of theelement 148D,148E in the second direction 404. In various embodimentsthe delay Z can be varied over a range of one, two, five, ten or twentypicoseconds. The delay steps of the element 148D are typically aboutone-quarter to five picoseconds for a channel bandwidth of 50 GHz butmay be as small as 20 femtoseconds (fs) or even less. In terms of amodulation symbol time, the delay steps are typically one to twentypercent of the modulation symbol time for the modulated optical inputsignal but may be as small as 0.025% or even less. With respect to thechannel bandwidth or modulation bandwidth for the modulated opticalinput signal 24, the delay steps are typically one to twenty percent butmay be as small as 0.025% or even less of the inverse of the bandwidth.

The positioning device 175D has a means of nudging or positioning theelements 148D and 148E in the second direction 404. For good positioncontrol, the positioning device 175D may have a screw 423. Manualoperation by a technician or a stepping motor 424 controls a rotation433 of the screw 423 to push or pull the element 148D in the seconddirection 404 based information from the bandwidth FSR control algorithm133D. Brackets 426 retain the screw 423 and the motor 424 in a DLIhousing with respect to the signals 400. The positioning device 175E maybe constructed in a similar way. Some fixing means, such as tie downstraps, fix the elements 148D and 148E once the elements 148D are 148Eare properly positioned. The fixing means and/or brackets 426 mayrequire shock absorption material to isolate the element 148D and 148Efrom mechanical vibration of the DLI housing.

FIG. 12A illustrates the delay element 148D (FIG. 6D) with stair steps406 having risers 242D perpendicular to the first direction 402 andtreads 244D about parallel to the first direction 402. The signals 400traverse the element 148D with entry or exit points at the risers 242D.The sizes of the steps of the delay Z are proportional to the lengths ofthe treads 244D projected into the first direction 402. A side 408 ofthe element 148D opposite to the risers 242D is parallel to the risers242D in order to minimize jitter in the delay Z that might occur due tomechanical vibration of the receiver 20,120. Increasing the heights ofthe risers 242D increases immunity to mechanical shocks or largeamplitude vibrations for the delay Z.

FIG. 12B illustrates a variation of the stepped delay element 148Ddenoted as an element 148D1. The element 148D1 has segments 242D1disposed one above the other in the second direction 404 havingdifferent optical group indices; where the optical delay Z in a segment242D1 is proportional to the physical length of the element 148D1traversed by the signals 400 multiplied by the group index of thesegment 242D1. The sides of the element 148D1 where the signals 400enter and exit the element 148D1 are parallel in order to minimize thejitter in the delay Z caused by mechanical vibration of the receiver20,120. Increasing the heights of the segments 242D1 in the seconddirection 404 increases immunity for the delay Z to mechanical shocks orlarge amplitude vibrations.

FIG. 12C illustrates the delay element 148E having a triangular crosssection. A continuous smooth variation of the position of the element148E in the second direction 404 provides a continuous smooth variationof the delay Z.

FIG. 12D illustrates a variation of the delay element 148E, denoted asan element 148E1, having a trapezoidal cross section. A continuoussmooth variation of the position of the element 148E in the seconddirection 404 provides a continuous smooth variation of the delay Z.

FIG. 12E illustrates a variation of the delay element 148E, denoted asan element 148E2, having two elements 409 and 410 having triangularcross sections that are inverted with respect to each other. The element409 has a fixed position and the element 410 is positionable in thesecond direction 404. The signals 400 pass through both elements 409 and410 in the first direction 402 for a combined delay Z.

The elements 409 and 410 induce wavelength dependent beam deviationangles 411 and 412, respectively, due to the refractive indices of thematerials and the gradient angles between the sides of the materials andthe signals 400. The materials and the gradient angles may be selectedso that the wavelength dependence of the beam deviation angle 411compensates for the wavelength dependence of the beam deviation angle412 for providing a signal path that is largely independent ofwavelength.

First and second sides of the fixed element 409 are denoted as sides 413and 414 and first and second sides of the positionable element 410 aredenoted as sides 415 and 416. For the same material for the elements 409and 410, the sides 413 and 415 may be about parallel and the sides 414and 416 may be about parallel. However, the element 410 may be allowed asmall rotation with respect to the element 409. A continuous smoothvariation of the position of the movable part 410 in the seconddirection 404 while the fixed part 409 remains stationary in the seconddirection 404 provides a continuous smooth variation of the delay Z.

FIG. 13 illustrates a transfer FSR phase element 446 using a tilt angle448 for fine tuning a signal delay for adjusting phase of the transferfunctions G(ƒ) and H(ƒ), described above. The element 446 may be used inthe receivers 20 and 120 as elements 46 and 146; and may be used in theDLIs 150A-F in place of the elements 146A-F.

A portion of one of the two signal paths 232A-F or 234A-F (FIG. 6A-F) isdenoted as a signal path 434. Signals 450 in the signal path 434 passthrough the element 446 for providing a signal delay for adjusting theFSR phase for the transfer functions G(ƒ) and H(ƒ). The element 446 isprovided with a higher optical index than the optical index of thesignals in the signal path 434 outside the element 446.

The adjustable tilt angle 448 is adjusted with respect to the directionsof the signals 450 by a mechanical mechanism 474. The mechanism 474 iscontrolled by a transfer (FSR) phase controller 437 in the mannerdescribed above for the transfer FSR controllers 37, 137 and 137A-F.Adjusting the tilt angle 448 of the element 446 with respect to thesignals 450 provides a fine adjustment to the delay of the signals 450by changing the physical length traversed by the signals 450. Theelement 446 may be constructed with a material having an optical indexhaving minimal temperature dependence.

General Considerations

The signal delay provided by the transfer (FSR) phase elements 46, 146,146A-F and 446 must be adjustable over a range of at least one cycleperiod at the carrier frequency of the optical input signal 24 forproviding the transfer function phase adjustment. Its tuning resolutionand stability should be better than 1% of the carrier cycle period. Ifthe FSR phase adjustment is tuned by temperature, the thermal expansioncoefficient and the thermal group index coefficient will determine thescale factor between temperature change and FSR phase change. Forexample, a tuning plate made of LaSFN9 (by Schott A G of Mainz,Germany), the group index is approximately 1.8 and the sum of thethermal coefficients is approximately 9×10⁻⁶/K (Kelvin). The propagationdelay through a plate of thickness 3 mm is approximately 18 picoseconds,and the thermal tuning range is 0.162 fs/K. At a carrier frequency of200 terahertz (THz) the optical period is 5 femtoseconds (fs), so achange in FSR phase of one period would require a temperature change of31 K, held to a stability of 0.31 K. This is a practical result.

In contrast, the desired differential transit time Y (controlled byselecting the signal delay Z provided by the FSR bandwidth elements 48,148 and 148A-F is many cycles of the carrier frequency. In terms ofcycles of the carrier frequency, the desired time Y may be calculatedfrom the modulation system time divided by the carrier cycle timedivided by the desired FSR/R, the FSR/R that correctly compensates forintersymbol interference (ISI) in the modulated optical input signal 24.For example for a modulation symbol time of 23.3 picoseconds, a carriercycle time of 5 fs and a desired FSR/R of 1.01, the time Y is equivalentto 4613.86 cycles. For the same modulation symbol and carrier cycletimes and a desired FSR/R of two, the time Y is equivalent to 2330cycles. It is not be practical to combine the transfer (FSR) phaseelement and the FSR bandwidth element for the following reasons.

Taking the above example, for the thermally tuned transfer (FSR) phaseelement to provide the differential time Y, the phase element would havea delay range of about 2300 carrier cycle periods or 11.5 picoseconds(ps) in order to provide the FSR/R range from 1.01 to 2. This wouldrequire an impractical temperature range of 71000 K. The delay Z of theFSR bandwidth element 48, 148 and 148A-F need not provide all of thedifferential transit time Y. For example the time Y can be composed ofthe sum of the delay Z and a fixed differential transit time between thesignal paths 232A-F and 234A-F, respectively. However, even if the rangeof the delay Z is limited to one picosecond, the temperature therequired temperature tuning range is an impractical 7100 K.

It should be noted that the delay Z described throughout thisapplication is the time for two transits (roundtrip time) through of thetransfer function (FSR) bandwidth elements 48, 148 and 148A-F and thetransfer (FSR) phase signal delay described throughout this applicationthrough the transfer (FSR) phase elements 46, 146, 146A-F and 446 is thetime for two transits (roundtrip time). However, the receivers 20 and120, and DLIs 150 and 150A-F could be constructed for single signaltransits through either or both of the bandwidth and phase elementswhereby the delay Z and/or the transfer (FSR) phase signal delay areprovided by the times for single transits.

FIG. 6G illustrates a Gires-Tournois (GT) decoder 150G as an embodimentof the delay line interferometer (DLI) 150. The GT decoder 150G operatesas delay line interferometer where a filter implemented as aGires-Tournois etalon 250G acts as a reflector in one of the signalpaths. The etalon 250G is a periodic phase filter of frequencies havinga periodic phase response for a reflected signal. The frequencyfiltering in the reflected signal from the etalon 250G alters andreconstructs the constructive and destructive transfer functions G(ƒ)and H(ƒ) of the naturally occurring free spectral range for a delay lineinterferometer into which the etalon 250G is embedded.

The etalon 250G has a partially reflective front surface PR and a highlyreflective rear surface HR. The reflection coefficient of the partiallyreflective surface PR and the thickness, optical index and internalangle of incidence for the etalon 250G are selected in order to modifythe bandwidths of the constructive and destructive transfer functions ofthe GT decoder 150G to compensate for intersymbol interference in theoptical input signal 24 and minimize the bit error ratio of output datawithout affecting the differential transit time Y for differentiallydemodulating the input signal 24.

The GT decoder 150G has an input port 165G, a beam splitter cube 252Ghaving a partially reflecting first mirror 202G, a second mirror 204G, acompensation spacer 253G, a first intermediate spacer 254G, the GTelation 250G including an etalon phase tuning element 256G, an FSR phasetuning spacer 258G having an air gap 259G, a second intermediate spacer262G, and constructive and destructive output ports 166G and 168G. AnFSR phase tuning element 446G is mounted in the air gap 259G of thespacer 258G. Elements of the GT decoder 150G that are analogous toelements of the DLI's 150A-F use the same base reference numbers, forexample the first mirror 202G is functionally analogous to the firstmirrors 202A-F.

For descriptive purposes, the two signal paths within the DLI 150G arereferred to as a vertical signal path 232G and a horizontal signal path234G. The intermediate spacers 254G and 262G are constructed to havematching signal delays. The compensation spacer 253G compensates for thethickness of the FSR phase tuning spacer 258G so that the opticallengths from the mirror 202G to the second mirror 204G and from thesecond mirror 202G to the partially reflective surface PR are equalexcept for the effective optical length of the FSR phase tuning element446G. The GT etalon 250G provides the differential transit time Y fordifferentially demodulating the input signal 24.

The optical interfaces between the cube 252G and the compensation 253Gand between the differential spacer 148G and the intermediate spacer254G for the horizontal signal path 234G are antireflective surfaces AR.The optical interface between the intermediate spacer 254G and theetalon 250G for the horizontal signal path 234G is the partiallyreflective surface PR. The back side of the etalon 250G is the highlyreflective surface HR for reflecting signals within the etalon 150G. Theoptical interfaces between the cube 252G and the spacer 258G and betweenthe spacer 258G and the intermediate spacer 262G for the vertical signalpath 232G are antireflective surfaces AR. The back side of theintermediate spacer 262G is a highly reflective surface HR acting as thesecond mirror 204G for reflecting the vertical signal path 232G.

The input optical signal 24 enters the splitter cube 252G at the inputport 165G and illuminates the front side of the partially reflectingfirst mirror 202G. The first mirror 202G is set at an angle to theoptical signal 24 so that part of the signal 24 reflects into thevertical signal path 232G and part of the signal 24 is passes throughthe mirror 202G into the horizontal signal path 234G. The horizontalsignal path 234G continues through cube 252G, the spacer 253G and theintermediate spacer 254G to the etalon 250G. The etalon 250G reflects asignal in the horizontal signal path 234G according to its selectedreflection coefficient, thickness, index and internal incident angleback through the intermediate spacer 254G and the spacer 253G. Thereflected signal in the horizontal signal path 234G reenters the cube252G where part reflects from the back side of the first mirror 202G tothe constructive output port 166G and part passes through the back sideof the mirror 202G to the destructive output port 168G.

The vertical signal path 232G passes from cube 252G through the spacer258G and the intermediate spacer 262G to the second mirror 204G. Thesecond mirror 204G reflects a signal in the vertical signal path 232Gback through the intermediate spacer 262G and the spacer 258G back intothe cube 252G. Part of the reflected signal in the vertical signal path232G passes through the front side of the first mirror 202G to theconstructive output port 166G and part of the reflected signal in thevertical signal path 232G reflects from the front side of the firstmirror 202G to the destructive output port 168G.

The FSR phase tuning element 446G in the air gap 282G of the spacer 258Guses a tilt angle 448G for fine tuning a signal delay for adjusting theFSR phase of the natural transfer functions G(ƒ) and H(ƒ) for the GTdecoder 150G. The element 446G is provided with a higher optical indexthan the optical indices of the signals in the vertical signal path 232Gimmediately outside the element 446G. Adjusting the tilt angle 448G withrespect to the directions of the signals of the vertical signal path232G provides a fine adjustment to the delay of the signals 232G bychanging the physical length within the element 446G traversed by thesignals in the vertical signal path 232G. The tilt angle 448G iscontrolled by a mechanism 474G controlled by a transfer (FSR) phasecontroller 437G. The controller 437G may operate as described above forcontrollers 37, 137, 137A-F or 437. Or, the tilt angle 448G may beadjusted by the mechanism 474G with the use of vector network analyzertest equipment to obtain a desired phase of a periodic transfer functionof power versus frequency. In an alternative embodiment the element 446Ghas a temperature sensitive optical index and the mechanism 474G an ovenfor controlling the effective optical length of the element 246G bycontrolling its temperature.

The etalon phase tuning element 256G uses a tilt angle 268G for finetuning a periodic phase response of a reflection function versusfrequency for the GT etalon 250G so that the phase response isapproximately symmetrical about the carrier frequency of the inputsignal 24. The element 256G is provided with a higher optical index thanthe optical indices of the signals of the horizontal signal path 234Gimmediately outside the element 256G. Adjusting the tilt angle 268G withrespect to the directions of the signals within the etalon 250G providesa fine signal delay adjustment by changing the physical length traversedby the signals within the element 256G. The tilt angle 268G iscontrolled by a mechanism 272G controlled by an etalon frequencycontroller 274G. In an alternative embodiment the element 256G has atemperature sensitive optical index and the mechanism 272G an oven forcontrolling the effective optical length of the element 256G bycontrolling its temperature.

The GT decoder 150G has separate alignment of the filter phase responseof the GT etalon 250G and the FSR phase for the free spectral range forthe interferometer action of the GT decoder 150G. To align the GT etalon250G, a beam blocker 283G is inserted into the air gap 259G todisconnect or absorb signals in the vertical signal path 232G. A pieceof paper may be used for the beam blocker. The reflective filterperiodic phase response of the GT etalon 250G is aligned with thecarrier of the input signal 24 while the vertical signal path 232G isblocked. After the GT etalon 250G is aligned, the beam blocker 283G isremoved for aligning the FSR phase for the GT decoder 150G and fornormal operation.

FIG. 6H illustrates a Gires-Tournois (GT) decoder 150H an embodiment ofthe delay line interferometer (DLI) 150. The GT decoder 150H operates asdelay line interferometer where a filter implemented as a Gires-Tournoisetalon 250H acts as a reflector in one of the signal paths. The etalon250H is a periodic phase filter of frequencies having a periodic phaseresponse for a reflected signal. The frequency filtering in thereflected signal from the etalon 250H alters and reconstructs theconstructive and destructive transfer functions G(ƒ) and H(ƒ) of thenaturally occurring free spectral range for a delay line interferometerinto which the etalon 250H is embedded.

The etalon 250H has a partially reflective front surface shown as PR anda highly reflective rear surface shown as HR. The reflection coefficientof the partially reflective surface PR and the thickness, optical indexand internal angle of incidence for the etalon 250H are selected inorder to modify the bandwidths of the constructive and destructivetransfer functions of the DLI 150H to compensate for intersymbolinterference in the optical input signal 24 and minimize the bit errorratio of output data without affecting the differential transit time Yfor differentially demodulating the input signal 24.

The DLI 150H has an input port 165H, a beam splitter cube 252H having apartially reflecting first mirror 202H, a second mirror 204H, adifferential spacer 148H including an air gap 259H, the GT elation 250Hincluding an etalon phase tuning element 256H, and constructive anddestructive output ports 166G and 168G. An FSR phase tuning element 446His mounted in the air gap 259H of the spacer 148H. Elements of the GTdecoder 150H that are analogous to elements of the DLI's 150A-F use thesame base reference numbers, for example the first mirror 202H isfunctionally analogous to the first mirrors 202A-F.

For descriptive purposes, the two signal paths within the DLI 150G arereferred to as a vertical signal path 232H and a horizontal signal path234H. The differential spacer 148H provides the differential transittime Y for differentially demodulating the input signal 24 and hasadditional delay to compensate the signal delay in the etalon 150H.

The optical interface between the cube 252H and the differential spacer148H in the vertical signal path 232H is an antireflective surface AR.The back side of the differential spacer 148H is a highly reflectivesurface HR acting as the second mirror 204H for reflecting the verticalsignal path 232H. The optical interface between the cube 252H and theetalon 250H in the horizontal signal path 234H is the partiallyreflective surface PR. The back side of the etalon 250H is the highlyreflective surface HR for reflecting signals within the etalon 250H.

The input optical signal 24 enters the splitter cube 252H at the inputport 165H and illuminates the front side of the partially reflectingfirst mirror 202H. The first mirror 202H is set at an angle to theoptical signal 24 so that part of the signal 24 is reflected into thevertical signal path 232H and part of the signal 24 is passed throughthe mirror 202H into the horizontal signal path 234H. The horizontalsignal path 234H passes from cube 252H to the etalon 250H. The etalon250H reflects the horizontal signal path 234H according to its selectedreflection coefficient, thickness, index and internal incident angleback into the cube 252H where part reflects from the back side of thefirst mirror 202H to the constructive output port 166H and part passesthrough the back side of the mirror 202H to the destructive output port168H.

The vertical signal path 232H passes from cube 252H through thedifferential spacer 148H to the second mirror 204H. The second mirror204H reflects the vertical signal path 232H back through thedifferential spacer 148H into the cube 252H where part passes throughthe front side of the first mirror 202H to the constructive output port166H and part reflects from the front side of the first mirror 202H tothe destructive output port 168H.

The differential transit time Y for differentially demodulating theinput signal 24 is the difference in transit times between the verticaland horizontal signal paths 232G and 234H controlled by the differencein effective optical length between the differential spacer 148H and theetalon 250H.

The FSR phase tuning element 446H in the differential spacer 148H uses atilt angle 448H for fine tuning a signal delay for adjusting the FSRphase of the natural transfer functions G(ƒ) and H(ƒ) for the GT decoder150H. The element 446H is provided with a higher optical index than theoptical indices of the signals in the vertical signal path 232Himmediately outside the element 446H. Adjusting the tilt angle 448H withrespect to the directions of the signals of the vertical signal path232H provides a fine adjustment to the delay of the signals 232H bychanging the physical length within the element 446G traversed by thevertical signal path 232H. The tilt angle 448H is controlled be amechanism 474H controlled by a transfer (FSR) phase controller 437H. Thecontroller 437H may operate as described above for controllers 37, 137,137A-F or 437. Or, the tilt angle 448H may be adjusted by the mechanism474H with the use of vector network analyzer test equipment to obtain adesired phase for a periodic transfer function for power versusfrequency. In an alternative embodiment the element 446H has atemperature sensitive optical index and the mechanism 474H an oven forcontrolling the effective optical length of the element 446H bycontrolling its temperature.

The etalon phase tuning element 256H uses a tilt angle 268H for finetuning the phase of the reflection function versus frequency of the GTetalon 250H so that the periodic phase response of the reflectionfunction is symmetrical about the carrier frequency of the input signal24. The element 256H is provided with a higher optical index than theoptical indices of the signals within the etalon 250H immediatelyoutside the element 256H. Adjusting the tilt angle 268H with respect tothe directions of the signals within the etalon 250H provides a finedelay adjustment by changing the physical length within the element 446Htraversed by the signals within the etalon 250H. The tilt angle 268H iscontrolled by a mechanism 272H controlled by an etalon frequencycontroller 274H. In an alternative embodiment the element 256H has atemperature sensitive optical index and the mechanism 272H an oven forcontrolling the effective optical length of the element 256H bycontrolling its temperature.

The GT decoder 150H has separate alignment of the filter phase responseof the GT etalon 250H and the FSR phase for the free spectral range forthe interferometer action of the GT decoder 150H. To align the GT etalon250H, a beam blocker 283H is inserted into the air gap 259H todisconnect or absorb signals in the vertical signal path 232H. A pieceof paper may be used for the beam blocker. The reflective filterperiodic phase response of the GT etalon 250H is aligned with thecarrier of the input signal 24 while the vertical signal path 232H isblocked. After the GT etalon 250H is aligned, the beam blocker 283H isremoved for aligning the FSR phase for the GT decoder 150H and fornormal operation.

FIG. 14 is a chart of the periodic phase response versus frequency ofthe signal reflection from the GT etalon 250G or 250H according to anequation shown below for r_(sum) where r_(sum) is the field of thereflected signal divided by the field of the incident signal. In theequation for r_(sum), the r₁ is the field reflection coefficient for thepartially reflective PR surface of the etalon 250G or 250H, the n is anoptical index of the material for the etalon 250G or 250H, thek=2π/λ=2πv/c is an angular wave number where the λ is the opticalwavelength or the v is the optical frequency of the input signal 24, theL is a thickness for the etalon 250G or 250H, and the θ is an internalangle of incidence for the etalon 250G or 250H.

$r_{sum} = {\frac{E_{reflected}}{E_{incident}} = \frac{1 + {r_{1}{{Exp}\left( {{- }\; 2\; {nkL}\; \cos \; \theta} \right)}}}{1 + {r_{1}{{Exp}\left( {{2}\; {nkL}\; \cos \; \theta} \right)}}}}$

The period of the reflection phase is provided by the interaction of theindex n, the thickness L and the angle θ. The |r_(sum)|² versusfrequency is constant except for the effects of diffraction and residuallosses. The bandwidth of the GT decoder 150G or 150H depends upon thephase response reflection of the GT etalon 250G or 250H which dependsupon the reflection coefficient r₁ of a coating for the PR surface. Thechart shows the phase response reflection r_(sum) for field reflectioncoefficients r₁ of 0.4, 0.7 and 0.99.

The appropriate coating for the coefficient r₁ is selected in order tomodify the natural FSR bandwidth for providing the reconfiguredbandwidth of the transfer function of the GT decoder 150G or 150H tocompensate for intersymbol interference or minimize bit error ratiobased on the optical channel or modulation bandwidth for a particularend user. At the same time the free spectral range of the interferometeroperation of the GT decoder 250G or 250H may be held constant, forexample at 50 GHz, to match a standard ITU channel plan.

A simulation program is used during design and development based onparameters and characteristics of the transmitter 12, channel 16 and thereceiver 20 or 120 for the system 10 for providing computer simulationsfor eye diagrams, bit error ratios and other results. The parameters forthe reflection coefficient r₁ are adjusted with the computer simulationsfor optimizing the performance of the system 10 by obtaining the widesteye opening, the least degradation effect from intersymbol interference,or the lowest bit error ratio. Such computer simulation program isavailable as a Photonic Design Automation (PDA) program fromVPIphotonics a division of VPIsystems of Holmdel, N.J., or PhotonicDesign Software program from Optiwave Systems Inc. of Ottawa, Ontario,Canada.

The reflection coefficient r₁ of the partially reflective PR surface forthe GT etalon 250G or 250H can be tuned using an approach described byLawrence H. Domash at Aegis Semiconductor, Inc. of Woburn, Wash., forthe Optical Society of America in 2004. The partially reflective PRsurface is made as a flexible homogenous coating in a thin film PECVDprocess with hydrogenated amorphous silicon (a-Si—H) having athermo-optic characteristic. The thermo-optic characteristic enables thereflection coefficient r₁ to be controlled by controlling itstemperature with an oven.

The term “etalon” comes from a French word étalon meaning “measuringgauge” or “standard”. A Fabry-Pérot etalon is typically made of atransparent plate with two reflecting surfaces. Its transmissionspectrum as a function of wavelength exhibits a periodic transmissionresponse corresponding to resonances of the etalon. In the Fabry-Pérotetalon the front and back surfaces are partially reflective. TheGires-Tournois etalon is a special case of the Fabry-Pérot etalon whereone of the surfaces is highly reflective.

FIG. 15 is a flow chart of a tuning adjustment method for the GTdecoders 150G and 150H. One or any combination of these steps for thismethod may be stored on a tangible medium 500 in a computer-readableform as instructions to a computer for carrying out the step or steps.

As described above one of the reflecting mirrors in a delay lineinterferometer is replaced by a Gires-Tournois (GT) etalon to create aGT decoder. Such GT decoder may be considered to have two transferfunction phases—the phase of the transfer function for the free spectralrange of the delay line interferometer corresponding to the differentialdelay for demodulation of a differentially modulated signal and thephase of the transfer function of the reflection of the GT etalon. Inpractice it might be difficult to construct such GT decoder having theproper transfer function phases with respect to the carrier frequency ofan input signal or the carrier frequencies of several channels for theinput signal unless the phases are adjustable. In the GT decoders 150Gand 150H the FSR phase is adjusted by adjusting the optical signal delayin the elements 446G and 446H and the GT etalon phase is adjusted byadjusting the optical signal delay in the elements 256G and 256H.

A method of adjusting the two phases uses test equipment for measuringoptical amplitude (or power) and phase versus frequency. Such testequipment is commercially available as an optical vector networkanalyzer from Luna Technologies of Blacksburg, Va.

Step 502: Connect the GT decoder to the network analyzer so that lightis launched from the analyzer into the input port of the GT decoder andreceived in the analyzer from one of the decoder output ports (eitherone).

Step 504: Insert a beam-blocker in the non-GT arm (blocking the verticalsignal paths 232G and 232H for the GT decoders 150G and 150H) of the GTdecoder to stop any reflection from that arm of the GT decoder to thedecoder output port.

Step 506: While measuring optical signal phase versus frequency, adjustthe transfer function frequency response (by adjusting the effectiveoptical length of the elements 256G or 256H) of the etalon so that thewidest linear part of the phase response is centered about the desiredoptical carrier wavelength. Lock the tuning for this adjustment.

Step 508: Remove the beam-blocker from the non-GT arm.

Step 510: While using the analyzer to measure optical power (oramplitude) versus frequency, adjust the FSR phase tuning of the non-GTarm to center the decoder's delay line interferometer transfer functionof power (or amplitude) on the desired optical carrier wavelength. Lockthe tuning for this adjustment. The GT etalon is now ready for normaloperation.

FIGS. 16A and 16B are charts showing exemplary optical transferfunctions for a standard delay line interferometer and an interferometerconstructed as the GT decoder 150G or 150H of the present invention. Thevertical axes show power transmission and the horizontal axes showfrequency of the input signal 24 with a center frequency at 194terahertz.

FIG. 16A shows the constructive and destructive transfer functions G(ƒ)and H(ƒ) for the free spectral range of a delay line interferometer forthe transit time difference Y of 20 picoseconds for differentialdemodulation of the input signal 24. The cyclic (in the frequencydomain) response of the transfer functions G(ƒ) and H(ƒ) is the naturalcharacteristic of the free spectral range of a delay line interferometerwhere the differential spacers 148G and 148H provide signal delays ofone-half the differential transit time Y (the signals in the decoders150G and 150H have two transits through the spacer 148G or 148H). It isnoted that the spacer 148H provides an additional signal delay tocompensate a signal delay in the etalon 250H. The transit timedifference Y defines the natural free spectral range (FSR) period andbandwidth for the transfer functions G(ƒ) and H(ƒ) for the delay lineinterferometer.

FIG. 16B shows the constructive and destructive transfer functions forthe GT decoders 150G and 150H for the same transit time difference Y of20 picoseconds. The natural constructive and destructive transferfunctions G(ƒ) and H(ƒ) are altered by the periodic phase filteringaction of the GT etalon 250G or 250H in order to reconfigure, and inmost cases increase, the bandwidths of the transfer functions. This maybe beneficial because the same GT decoder 150G or 150H can be matchedfor the FSR phase for the system 10 having several channels withoutreadjusting the FSR phase for each channel. For example, a differentialtransit time Y of 20 picoseconds in a system having 50 GHz channelspacing can be used for providing a constant FSR phase alignment for allchannels while separately selecting transfer function bandwidths in theGT decoder 150G or 150H according to an algorithm or dynamic feedbackfor compensating for intersymbol interference and minimizing bit errorratio.

Although the present invention has been described in terms of thepresently preferred embodiments, it is to be understood that suchdisclosure is not to be interpreted as limiting. Various alterations andmodifications will no doubt become apparent to those skilled in the artafter having read the above disclosure. Accordingly, it is intended thatthe appended claims be interpreted as covering all alterations andmodifications as fall within the true spirit and scope of the presentinvention.

1. An optical receiver for receiving a modulated optical input signal,comprising: a decoder for splitting said input signal into two signalpaths having a transit time difference for providing a differentiallydemodulated signal to at least one of constructive and destructiveoutputs, said transit time difference defining a free spectral range(FSR) for defining an FSR bandwidth; and a periodic phase filter havinga periodic phase response versus frequency in a first of said signalpaths for altering said FSR bandwidth for providing a reconfiguredbandwidth for said demodulated signal.
 2. The receiver of claim 1,wherein: the periodic phase filter is an etalon.
 3. The receiver ofclaim 1, wherein: the periodic phase filter is a Gires-Tournois etalonfor reflecting a signal in said first signal path.
 4. The receiver ofclaim 1, wherein: the periodic phase filter is constructed for providingsaid reconfigured bandwidth for compensating for intersymbolinterference in said input signal.
 5. The receive of claim 1, wherein:said periodic phase filter is constructed for providing saidreconfigured bandwidth for minimizing bit error ratio for saiddemodulated signal.
 6. The receiver of claim 1, wherein: the periodicphase filter is constructed for providing said filter phase response asa reflection function versus frequency.
 7. The receiver of claim 1,wherein: the periodic phase filter is constructed for said filter phaseresponse having a period about equal to a channel spacing of said inputsignal.
 8. The receiver of claim 1, wherein: the periodic phase filteris constructed for said filter phase response to be symmetrical about acarrier frequency for said input signal.
 9. The receiver of claim 1,wherein: the periodic phase filter includes a filter phase tuningelement having a first adjustable signal delay for tuning said filterphase response with respect to a frequency of said input signal.
 10. Thereceiver of claim 9, wherein: said filter phase tuning element has anadjustable angle with respect to a direction of a signal in said firstsignal path for adjusting said first signal delay.
 11. The receiver ofclaim 9, further comprising: an FSR phase tuning element in one of saidsignal paths for providing a second adjustable signal delay for tuningan FSR phase for said free spectral range, the FSR phase tuning elementseparate from the filter phase tuning element.
 12. The receiver of claim11, wherein: said FSR phase tuning element has an adjustable angle withrespect to a direction in said one of said signal paths for tuning saidsecond signal delay.
 13. The receiver of claim 12, wherein: said FSRphase tuning element is disposed in a second of said signal paths; andsaid second signal path includes an air gap, said air gap constructedfor a beam blocker to be inserted for blocking said second signal pathfor allowing separate tuning of said filter phase response from said FSRphase.
 14. The receiver of claim 1, wherein: the periodic phase filterincludes a partially reflective surface, said first signal path havingan incident signal illuminating said partially reflective surface and areflected signal issuing from said partially reflective surface, a ratioof said reflected signal to said incident signal having said filterphase response.
 15. The receiver of claim 14, wherein: said partiallyreflective surface in constructed with a field reflection coefficientmagnitude between 0.1 and 0.6.
 16. The receiver of claim 14, wherein:said partially reflective surface has a reflection coefficient selectedfor compensating for intersymbol interference for said input signal. 17.The receiver of claim 14, wherein: said partially reflective surface hasa reflection coefficient selected for minimizing bit error ratio forsaid demodulated signal.
 18. The receiver of claim 1, wherein: thedecoder includes a partially reflecting first mirror for splitting saidinput signal to a first of said signal paths and a second of said signalpaths, a first spacer having a first thickness having an FSR phasetuning element in said second signal path for tuning an FSR phase forsaid free spectral range, a second spacer in said first signal pathhaving a second thickness for compensating said first thickness, and theperiodic phase filter in said first signal path for providing saidperiodic phase response and said transit time difference.
 19. Thereceiver of claim 1, wherein: the decoder includes a partiallyreflecting first mirror for splitting said input signal to said firstand a second of said signal paths, the periodic phase filter in saidfirst signal path for providing said periodic phase response, and adifferential spacer having an FSR phase tuning element in said secondsignal path for tuning an FSR phase for said free spectral range, thedifferential spacer having a thickness for providing said transit timedifference and compensating a signal delay for the periodic phasefilter.
 20. A method for receiving a modulated optical input signal,comprising: splitting said input signal into two signal paths having atransit time difference; differentially demodulating said input signalbased on said transit time difference, said transit time differencedefining a free spectral range (FSR) for defining an FSR bandwidth;issuing said demodulated signal to at least one of constructive anddestructive outputs; and filtering a signal in a first of said signalpaths for providing a periodic phase response versus frequency foraltering said FSR bandwidth to provide a reconfigured bandwidth for saiddemodulated signal.
 21. The method of claim 20, wherein: filteringincludes frequency filtering said signal in said first signal path withan etalon.
 22. The method of claim 20, wherein: filtering includesreflecting said signal in said first signal path with a Gires-Tournoisetalon.
 23. The method of claim 20, wherein: altering said FSR bandwidthincludes providing said reconfigured bandwidth for compensating forintersymbol interference in said input signal.
 24. The method of claim20, wherein: altering said FSR bandwidth includes providing saidreconfigured bandwidth for minimizing bit error ratio for saiddemodulated signal.
 25. The method of claim 20, wherein: filteringincludes providing said filter phase response as a reflection functionversus frequency.
 26. The method of claim 20, wherein: filteringincludes constructing said filter phase response with a period aboutequal to a channel spacing of said input signal.
 27. The method of claim20, wherein: filtering includes constructing said filter phase responseto be symmetrical about a carrier frequency for said input signal. 28.The method of claim 20, wherein: filtering includes tuning said filterphase response to a frequency of said input signal by adjusting a firstsignal delay in said first signal path.
 29. The method of claim 28,wherein: adjusting said first signal delay includes adjusting an angleof a filter phase tuning element with respect to a direction of a signalin said first signal path.
 30. The method of claim 28, furthercomprising: tuning an FSR phase for said free spectral range byadjusting a second signal delay in one of said signal paths with an FSRphase tuning element, said FSR phase tuning element separate from saidfilter phase tuning element.
 31. The method of claim 30, wherein: tuningsaid FSR phase includes adjusting an angle of said FSR phase tuningelement with respect to a direction of a signal in said one of saidsignal paths.
 32. The method of claim 31, further comprising: disposingsaid FSR phase tuning element in a second of said signal paths;inserting a beam blocker in an air gap in said second signal path; andtuning said filter phase response while said beam blocker is inserted.33. The method of claim 20, wherein: filtering includes illuminating apartially reflecting surface with an incident signal and receiving areflected signal from said partially reflecting surface, a ratio of saidreflected signal to said incident signal having said filter phaseresponse.
 34. The method of claim 33, further comprising: constructingsaid partially reflective surface for a field reflection coefficientmagnitude between 0.1 and 0.6.
 35. The method of claim 33, furthercomprising: constructing said partially reflective surface with areflection coefficient for compensating for intersymbol interference forsaid input signal.
 36. The method of claim 33, further comprising:constructing said partially reflective surface with a reflectioncoefficient for minimizing bit error ratio for said demodulated signal.37. The method of claim 20, wherein: splitting said input signalincludes splitting said input signal into a first of said signal pathsand a second of said signal paths; disposing a first spacer having afirst thickness having an FSR phase tuning element in said second signalpath for tuning an FSR phase for said free spectral range; disposing asecond spacer having a second thickness in said first signal path forcompensating for said first thickness; and disposing a periodic phasefilter in said first signal path for providing said periodic phaseresponse and said transit time difference.
 38. The method of claim 20,wherein: splitting said input signal includes splitting said inputsignal into a first of said signal paths and a second of said signalpaths; disposing a periodic phase filter in said first signal path forproviding said periodic phase response, and disposing a differentialspacer having an FSR phase tuning element in said second signal path fortuning an FSR phase for said free spectral range, said differentialspacer having a thickness for providing said transit time difference andcompensating a signal delay for the periodic phase filter.